{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T11:07:58Z","timestamp":1725793678358},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,5]]},"DOI":"10.1109\/iscas.2015.7168712","type":"proceedings-article","created":{"date-parts":[[2015,7,30]],"date-time":"2015-07-30T17:31:36Z","timestamp":1438277496000},"page":"629-632","source":"Crossref","is-referenced-by-count":2,"title":["An improved scan design for minimization of test power under routing constraint"],"prefix":"10.1109","author":[{"given":"Aijiao","family":"Cui","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tingting","family":"Yu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gang","family":"Qu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mengyang","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TENCON.2006.344008"},{"key":"ref3","first-page":"488","article-title":"Efficient scan chain design for power minimization during scan testing under routing constraint","author":"bonhmme","year":"2003","journal-title":"IEEE Int Test Conf"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2013.6509652"},{"key":"ref5","first-page":"648","article-title":"A routability constrained scan chain ordering technique for test power reduction","author":"huang","year":"2006","journal-title":"Asia and South Pacific Conference on Design Automation"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISICIR.2014.7029573"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/3477.764879"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-0928-2"},{"article-title":"Essentials of Electronic Testing","year":"2000","author":"bushnell","key":"ref1"}],"event":{"name":"2015 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2015,5,24]]},"location":"Lisbon, Portugal","end":{"date-parts":[[2015,5,27]]}},"container-title":["2015 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7152138\/7168553\/07168712.pdf?arnumber=7168712","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T15:04:36Z","timestamp":1490367876000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7168712\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/iscas.2015.7168712","relation":{},"subject":[],"published":{"date-parts":[[2015,5]]}}}