{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T07:05:34Z","timestamp":1730271934536,"version":"3.28.0"},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,5]]},"DOI":"10.1109\/iscas.2015.7169180","type":"proceedings-article","created":{"date-parts":[[2015,7,30]],"date-time":"2015-07-30T17:31:36Z","timestamp":1438277496000},"page":"2449-2452","source":"Crossref","is-referenced-by-count":7,"title":["Unified approach for simulation of statistical reliability in nanoscale CMOS transistors from devices to circuits"],"prefix":"10.1109","author":[{"given":"A.","family":"Asenov","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Ding","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Reid","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Asenov","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Amoroso","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Adamu-Lema","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Gerrer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2013.02.016"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/43.806802"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.885683"},{"year":"0","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2090158"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2254490"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.885683"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.813457"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2010.2069080"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.53"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2009.5173283"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.811418"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2012.6241839"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2004.03.019"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2164543"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488856"},{"key":"ref2","first-page":"130","article-title":"Comprehensive SRAM design methodology for RTN reliability","volume":"2011","author":"takeuchi","year":"2011","journal-title":"VLSI Symp Tech Dig"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131500"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2011.2136316"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6531972"}],"event":{"name":"2015 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2015,5,24]]},"location":"Lisbon, Portugal","end":{"date-parts":[[2015,5,27]]}},"container-title":["2015 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7152138\/7168553\/07169180.pdf?arnumber=7169180","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T15:27:11Z","timestamp":1490369231000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7169180\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/iscas.2015.7169180","relation":{},"subject":[],"published":{"date-parts":[[2015,5]]}}}