{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,28]],"date-time":"2026-07-28T02:17:59Z","timestamp":1785205079239,"version":"3.55.0"},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,5]]},"DOI":"10.1109\/iscas.2015.7169304","type":"proceedings-article","created":{"date-parts":[[2015,7,30]],"date-time":"2015-07-30T21:31:36Z","timestamp":1438291896000},"page":"2944-2947","source":"Crossref","is-referenced-by-count":5,"title":["Reactive rejuvenation of CMOS logic paths using self-activating voltage domains"],"prefix":"10.1109","author":[{"given":"Rizwan A.","family":"Ashraf","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ahmad","family":"Al-Zahrani","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Navid","family":"Khoshavi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ramtin","family":"Zand","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Soheil","family":"Salehi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Arman","family":"Roohi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mingjie","family":"Lin","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ronald F.","family":"DeMara","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2007.48"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2429384.2429543"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/2491477.2491482"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/2248487.1950405"},{"key":"ref14","first-page":"58","article-title":"Uncertainty-aware Circuit Optimization","author":"bai","year":"2002","journal-title":"39th Proceedings of Design Automation Conference"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2014.6865087"},{"key":"ref16","year":"0","journal-title":"HSPICE Synopsys Inc"},{"key":"ref17","article-title":"MOS Device Aging Analysis with HSPICE and CustomSim","author":"tudor","year":"2011","journal-title":"Synopsys technical report"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2013.6691097"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837452"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2007145"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2220912"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2009.4796528"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253179"},{"key":"ref2","first-page":"329","article-title":"Design and CAD Challenges in 45nm CMOS and beyond","author":"frank","year":"2006","journal-title":"Proc International Conference on Computer-Aided Design (ICCAD)"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2005.110"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2206781.2206793"}],"event":{"name":"2015 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Lisbon, Portugal","start":{"date-parts":[[2015,5,24]]},"end":{"date-parts":[[2015,5,27]]}},"container-title":["2015 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7152138\/7168553\/07169304.pdf?arnumber=7169304","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T19:26:43Z","timestamp":1490383603000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7169304\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/iscas.2015.7169304","relation":{},"subject":[],"published":{"date-parts":[[2015,5]]}}}