{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T01:02:57Z","timestamp":1725411777147},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/iscas.2016.7527251","type":"proceedings-article","created":{"date-parts":[[2016,11,1]],"date-time":"2016-11-01T20:59:26Z","timestamp":1478033966000},"page":"385-388","source":"Crossref","is-referenced-by-count":3,"title":["Resistance impact by long connections on electrical behavior of integrated Memristive Biosensors"],"prefix":"10.1109","author":[{"given":"I.","family":"Tzouvadaki","sequence":"first","affiliation":[]},{"given":"A.","family":"Vallero","sequence":"additional","affiliation":[]},{"given":"F.","family":"Puppo","sequence":"additional","affiliation":[]},{"given":"G.","family":"De Micheli","sequence":"additional","affiliation":[]},{"given":"S.","family":"Carrara","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1007\/s12668-011-0002-9"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1007\/s00339-011-6264-9"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/BioCAS.2014.6981759"},{"key":"ref6","article-title":"Fabrication and characterization of Silicon nanowire-based biosensor","author":"kim","year":"2009","journal-title":"3rd International Conference on Integrity Reliability and Failure"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/JSEN.2015.2456336"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1016\/j.snb.2012.04.089"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1021\/es1043547"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/NEBC.2012.6206936"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/PROC.1976.10092"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1039\/B913912E"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TCT.1971.1083337"}],"event":{"name":"2016 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2016,5,22]]},"location":"Montr\u00e9al, QC, Canada","end":{"date-parts":[[2016,5,25]]}},"container-title":["2016 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7515073\/7527154\/07527251.pdf?arnumber=7527251","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,10,14]],"date-time":"2020-10-14T16:16:32Z","timestamp":1602692192000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7527251"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/iscas.2016.7527251","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}