{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,29]],"date-time":"2025-08-29T09:59:21Z","timestamp":1756461561622},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/iscas.2016.7527357","type":"proceedings-article","created":{"date-parts":[[2016,11,1]],"date-time":"2016-11-01T16:59:26Z","timestamp":1478019566000},"page":"782-785","source":"Crossref","is-referenced-by-count":4,"title":["Multi-bit flip-flop generation considering multi-corner multi-mode timing constraint"],"prefix":"10.1109","author":[{"given":"Taehee","family":"Lee","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"JongWon","family":"Yi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Joon-Sung","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2177460"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/2560519.2560520"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2007.20"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176580"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2009.4810370"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2177459"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2165716"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2010.5647784"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2013.6691177"},{"key":"ref9","first-page":"1","article-title":"Logic Synthesis of Low-power ICs with Ultra-wide Voltage and Frequency Scaling","author":"echeverri","year":"2014","journal-title":"Proc Design Automation & Test in Europe Conference & Exhibition (DATE)"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/2451916.2451955"}],"event":{"name":"2016 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2016,5,22]]},"location":"Montr\u00e9al, QC, Canada","end":{"date-parts":[[2016,5,25]]}},"container-title":["2016 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7515073\/7527154\/07527357.pdf?arnumber=7527357","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,10,14]],"date-time":"2020-10-14T12:15:57Z","timestamp":1602677757000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7527357"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/iscas.2016.7527357","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}