{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,25]],"date-time":"2026-07-25T16:31:47Z","timestamp":1784997107051,"version":"3.55.0"},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/iscas.2016.7527471","type":"proceedings-article","created":{"date-parts":[[2016,11,1]],"date-time":"2016-11-01T16:59:26Z","timestamp":1478019566000},"page":"1238-1241","source":"Crossref","is-referenced-by-count":8,"title":["Boosted sensing for enhanced read stability in STT-MRAMs"],"prefix":"10.1109","author":[{"given":"Kien Trinh","family":"Quang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sergio","family":"Ruocco","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Massimo","family":"Alioto","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","article-title":"SPICE Models for Magnetic Tunnel Junctions Based on Monodomain Approximation","author":"fong","year":"0"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2011.2169456"},{"key":"ref12","author":"ross","year":"2014","journal-title":"Introduction to Probability and Statistics for Engineers and Scientists"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2011.6055315"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1989.572629"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757418"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.825251"},{"key":"ref3","first-page":"2313","article-title":"Modeling the impact of dynamic voltage scaling on 1T-1J STT-RAM write energy and performance","author":"trinh","year":"2015","journal-title":"ISCAS"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2239671"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2272587"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2170778"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2006.357911"},{"key":"ref2","year":"0"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/2463585.2463589"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/SISPAD.2011.6035047"}],"event":{"name":"2016 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Montr\u00e9al, QC, Canada","start":{"date-parts":[[2016,5,22]]},"end":{"date-parts":[[2016,5,25]]}},"container-title":["2016 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7515073\/7527154\/07527471.pdf?arnumber=7527471","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,10,14]],"date-time":"2020-10-14T12:15:54Z","timestamp":1602677754000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7527471"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/iscas.2016.7527471","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}