{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,30]],"date-time":"2026-04-30T17:18:22Z","timestamp":1777569502671,"version":"3.51.4"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/iscas.2017.8050474","type":"proceedings-article","created":{"date-parts":[[2017,9,28]],"date-time":"2017-09-28T16:33:32Z","timestamp":1506616412000},"page":"1-4","source":"Crossref","is-referenced-by-count":7,"title":["Zero-bias true random number generator using LFSR-based scrambler"],"prefix":"10.1109","author":[{"given":"Wei","family":"Mao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yongfu","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chun-Huat","family":"Heng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yong","family":"Lian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2014.7008853"},{"key":"ref3","first-page":"414","article-title":"1200 um 2 Physical Random-Number Generators Based on SiN MOSFET for Secure Smart-Card Application","author":"matsumoto","year":"2008","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2006.1696222"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-21040-2_12"},{"key":"ref8","first-page":"175","article-title":"A comparison of post-processing techniques for biased random number generators","author":"siew","year":"2011","journal-title":"Proc of the 5th Workshop in Information Security Theory and Practice"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2009.5357221"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2010.2052515"},{"key":"ref9","first-page":"800","article-title":"A Statistical Test Suite for the Validation of Random Number Generators and Pseudo Random Number Generators for Cryptographic Applications","year":"2010","journal-title":"National Institute of Standards and Technology"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2013.6691000"}],"event":{"name":"2017 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Baltimore, MD, USA","start":{"date-parts":[[2017,5,28]]},"end":{"date-parts":[[2017,5,31]]}},"container-title":["2017 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8014728\/8049747\/08050474.pdf?arnumber=8050474","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,10,27]],"date-time":"2017-10-27T17:52:12Z","timestamp":1509126732000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8050474\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/iscas.2017.8050474","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}