{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,11,8]],"date-time":"2024-11-08T05:26:43Z","timestamp":1731043603817,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2017,5,1]],"date-time":"2017-05-01T00:00:00Z","timestamp":1493596800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2017,5,1]],"date-time":"2017-05-01T00:00:00Z","timestamp":1493596800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/iscas.2017.8050496","type":"proceedings-article","created":{"date-parts":[[2017,9,28]],"date-time":"2017-09-28T20:33:32Z","timestamp":1506630812000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["CMOS mixed signal SoC for low-side current sensing"],"prefix":"10.1109","author":[{"given":"T","family":"Rahul","sequence":"first","affiliation":[{"name":"ams Semiconductors India Pvt., Hyderabad, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Veeresh Babu","family":"Vulligaddalat","sequence":"additional","affiliation":[{"name":"ams Semiconductors India Pvt., Hyderabad, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bibhu","family":"Datta Sahoo","sequence":"additional","affiliation":[{"name":"Dept. of ECE, University of Illinois, Urbana, IL 61801, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/4.826811"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2003.808892"},{"key":"ref12","first-page":"438","author":"ahuja","year":"2002","journal-title":"ISSCC"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2012.2206455"},{"key":"ref14","first-page":"19","author":"zadeh","year":"1994","journal-title":"Midwest Symp on Circuits and Systems"},{"key":"ref15","first-page":"557","author":"xu","year":"2004","journal-title":"IEEE Intl Symp Circuits and Systems"},{"key":"ref4","first-page":"699","volume":"50","author":"nguyen","year":"2008","journal-title":"IEEE Trans on Circuits and Systems-II"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"1663","DOI":"10.1109\/JSSC.2003.810058","volume":"38","author":"hsu","year":"2003","journal-title":"IEEE J Solid-State Circuits"},{"key":"ref6","first-page":"4819","volume":"5","author":"dinc","year":"2005","journal-title":"IEEE Symposium on Circuits and Systems"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"496","DOI":"10.1109\/TCSI.2007.910643","volume":"55","author":"mak","year":"2008","journal-title":"IEEE Trans on Circuits and Systems-I"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2015.51"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2013.2240831"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"1584","DOI":"10.1109\/5.542410","volume":"39","author":"enz","year":"1996","journal-title":"Proc of IEEE"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2005695"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"3119","DOI":"10.1109\/ISCAS.2005.1465288","author":"ishida","year":"2005","journal-title":"Proc IEEE Int Symp Circuits Syst"}],"event":{"name":"2017 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2017,5,28]]},"location":"Baltimore, MD, USA","end":{"date-parts":[[2017,5,31]]}},"container-title":["2017 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8014728\/8049747\/08050496.pdf?arnumber=8050496","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,7]],"date-time":"2024-11-07T19:48:42Z","timestamp":1731008922000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8050496\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/iscas.2017.8050496","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}