{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,10]],"date-time":"2026-04-10T21:40:48Z","timestamp":1775857248818,"version":"3.50.1"},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/iscas.2017.8050629","type":"proceedings-article","created":{"date-parts":[[2017,9,28]],"date-time":"2017-09-28T16:33:32Z","timestamp":1506616412000},"page":"1-4","source":"Crossref","is-referenced-by-count":21,"title":["Investigation of DRAM PUFs reliability under device accelerated aging effects"],"prefix":"10.1109","author":[{"given":"Fatemeh","family":"Tehranipoor","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nima","family":"Karimian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wei","family":"Yan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"John A.","family":"Chandy","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2015.7372560"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2014.6865541"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2014.6783360"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2014.6855586"},{"key":"ref14","author":"randhawa","year":"2011","journal-title":"Analysis of impact of transistor aging effects on clock skew in nano-scale CMOS"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/20.560063"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2742060.2742069"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"9","DOI":"10.1145\/1278480.1278484","article-title":"physical unclonable functions for device authentication and secret key generation","author":"suh","year":"2007","journal-title":"2007 44th ACM\/IEEE Design Automation Conference DAC"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"1355","DOI":"10.1016\/j.microrel.2013.07.044","article-title":"BTI, HCI and TDDB aging impact in flipflops","volume":"53","author":"nunes","year":"2013","journal-title":"Microelectronics Reliability"},{"key":"ref5","author":"ram","year":"2010","journal-title":"Reliability analysis of dynamic logic circuits under transistor aging effects in nanotechnology"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2011.35"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2606658"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2017.24"},{"key":"ref1","first-page":"79","article-title":"Robust hardware true random number generators using dram remanence effets","author":"tehranipoor","year":"2016","journal-title":"International Symposium on Hardware-Oriented Security and Trust (HOST)"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2016.2638445"}],"event":{"name":"2017 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Baltimore, MD, USA","start":{"date-parts":[[2017,5,28]]},"end":{"date-parts":[[2017,5,31]]}},"container-title":["2017 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8014728\/8049747\/08050629.pdf?arnumber=8050629","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,3]],"date-time":"2019-10-03T22:12:17Z","timestamp":1570140737000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8050629\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/iscas.2017.8050629","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}