{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T11:48:41Z","timestamp":1759146521476},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/iscas.2017.8050670","type":"proceedings-article","created":{"date-parts":[[2017,9,28]],"date-time":"2017-09-28T20:33:32Z","timestamp":1506630812000},"page":"1-4","source":"Crossref","is-referenced-by-count":4,"title":["An entropy test for determining whether a MUX PUF is linear or nonlinear"],"prefix":"10.1109","author":[{"given":"Anoop","family":"Koyily","sequence":"first","affiliation":[]},{"given":"Chen","family":"Zhou","sequence":"additional","affiliation":[]},{"given":"Chris H.","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Keshab K.","family":"Parhi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Elements of Information Theory","year":"2012","author":"cover","key":"ref10"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2934583.2934613"},{"key":"ref12","first-page":"543","article-title":"Estimating Delay Differences of Arbiter PUFs Using Silicon Data","author":"s v sandeep avvaru","year":"2016","journal-title":"Design Automation Test in Europe Conference Exhibition (DATE)"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"77","DOI":"10.1109\/ISCAS.2015.7168574","article-title":"RO PUF design in FPGAs with new comparison strategies","author":"liu","year":"2015","journal-title":"Circ and Syst (ISCAS) 2015 IEEE Int Symp"},{"key":"ref4","first-page":"9","article-title":"Physical unclonable functions for device authentication and secret key generation","author":"suh","year":"2007","journal-title":"Proceedings of the 44th Annual Design Automation Conference"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2013.2296525"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681648"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-44709-3_27"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-33027-8_17"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.2200\/S00622ED1V01Y201412SPT012"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2320516"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/586110.586132"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-14452-3_1"}],"event":{"name":"2017 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2017,5,28]]},"location":"Baltimore, MD, USA","end":{"date-parts":[[2017,5,31]]}},"container-title":["2017 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8014728\/8049747\/08050670.pdf?arnumber=8050670","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,4]],"date-time":"2019-10-04T02:12:26Z","timestamp":1570155146000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8050670\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/iscas.2017.8050670","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}