{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T19:26:53Z","timestamp":1725478013646},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/iscas.2017.8050753","type":"proceedings-article","created":{"date-parts":[[2017,9,28]],"date-time":"2017-09-28T16:33:32Z","timestamp":1506616412000},"page":"1-4","source":"Crossref","is-referenced-by-count":4,"title":["A size-adaptive time-step algorithm for accurate simulation of aging in analog ICs"],"prefix":"10.1109","author":[{"given":"P.","family":"Martin-Lloret","sequence":"first","affiliation":[]},{"given":"A.","family":"Toro-Frias","sequence":"additional","affiliation":[]},{"given":"J.","family":"Martin-Martinez","sequence":"additional","affiliation":[]},{"given":"R.","family":"Castro-Lopez","sequence":"additional","affiliation":[]},{"given":"E.","family":"Roca","sequence":"additional","affiliation":[]},{"given":"R.","family":"Rodriguez","sequence":"additional","affiliation":[]},{"given":"M.","family":"Nafria","sequence":"additional","affiliation":[]},{"given":"F.V.","family":"Fernandez","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/SMACD.2015.7301699"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2016.05.004"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2011.5784605"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/SMACD.2015.7301704"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-6163-0"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2016.05.002"}],"event":{"name":"2017 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2017,5,28]]},"location":"Baltimore, MD, USA","end":{"date-parts":[[2017,5,31]]}},"container-title":["2017 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8014728\/8049747\/08050753.pdf?arnumber=8050753","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,10,27]],"date-time":"2017-10-27T17:31:25Z","timestamp":1509125485000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8050753\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/iscas.2017.8050753","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}