{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T07:09:44Z","timestamp":1730272184596,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/iscas.2017.8050885","type":"proceedings-article","created":{"date-parts":[[2017,9,28]],"date-time":"2017-09-28T16:33:32Z","timestamp":1506616412000},"page":"1-4","source":"Crossref","is-referenced-by-count":2,"title":["A secure test solution for sensor nodes containing crypto-cores"],"prefix":"10.1109","author":[{"given":"Shoaleh Hashemi","family":"Namin","sequence":"first","affiliation":[]},{"given":"Ankit","family":"Mehta","sequence":"additional","affiliation":[]},{"given":"Parham H.","family":"Namin","sequence":"additional","affiliation":[]},{"given":"Rashid","family":"Rashidzadeh","sequence":"additional","affiliation":[]},{"given":"Majid","family":"Ahmadi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2398423"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2016.7538894"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2016.2613847"},{"journal-title":"IEEE Standard Testability Method for Embedded Core-based Integrated Circuits IEEE","article-title":"IEEE Std 1500™-2005","year":"2005","key":"ref13"},{"year":"0","key":"ref14"},{"key":"ref4","first-page":"9","article-title":"Design Principles for Tamper-Resistant Smartcard Processors","author":"kommerling","year":"1999","journal-title":"Proceedings of the USENIX Workshop on Smartcard Technology"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2005.42"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.89"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.862745"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.906483"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2007.70215"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/SIITME.2013.6743689"},{"key":"ref1","first-page":"22","article-title":"Vulnerabilities and Attacks in Wireless Sensor Networks","volume":"1","author":"benenson","year":"2008","journal-title":"Wireless Sensor Networks Security Cryptology & Information Security Series (CIS)"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2257903"}],"event":{"name":"2017 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2017,5,28]]},"location":"Baltimore, MD, USA","end":{"date-parts":[[2017,5,31]]}},"container-title":["2017 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8014728\/8049747\/08050885.pdf?arnumber=8050885","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,10,27]],"date-time":"2017-10-27T17:47:33Z","timestamp":1509126453000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8050885\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/iscas.2017.8050885","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}