{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T06:24:37Z","timestamp":1729664677814,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/iscas.2017.8051009","type":"proceedings-article","created":{"date-parts":[[2017,9,28]],"date-time":"2017-09-28T16:33:32Z","timestamp":1506616412000},"page":"1-4","source":"Crossref","is-referenced-by-count":3,"title":["CMOS luminescence lifetime sensor for white LED multi-spectral characterization"],"prefix":"10.1109","author":[{"given":"Guoqing","family":"Fu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sameer","family":"Sonkusale","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"crossref","first-page":"2546","DOI":"10.1109\/JSSC.2008.2005818","article-title":"A single-photon avalanche diode array for fluorescence lifetime imaging microscopy","volume":"43","author":"david","year":"2008","journal-title":"IEEE Journal of Solid-State Circuits"},{"key":"ref3","article-title":"Phosphor-conversion white light emitting diode using InGaN near-ultraviolet chip","volume":"41 4a","author":"yukio","year":"2002","journal-title":"Japanese Journal of Applied Physics"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JLT.2013.2292896"},{"key":"ref6","first-page":"4em06","article-title":"CMOS image sensor with lateral electric field modulation pixels for fluorescence lifetime imaging with subnanosecond time response","volume":"55 4s","author":"zhuo","year":"2016","journal-title":"Japanese Journal of Applied Physics"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"81114","DOI":"10.1063\/1.3216578","article-title":"Rate equation analysis of efficiency droop in InGaN light-emitting diodes","volume":"95","author":"han-youl","year":"2009","journal-title":"Applied Physics Letters"},{"key":"ref5","first-page":"1731","article-title":"A 65 nm CMOS digital phase imager for time-resolved fluorescence imaging","volume":"47 7","author":"jian","year":"2012","journal-title":"IEEE Journal of Solid-State Circuits"},{"key":"ref8","article-title":"CMOS Sensor for Dual Fluorescence Intensity and Lifetime Sesing Using Multicycle Charge Modulation","author":"guoqing","year":"2017","journal-title":"Custom Integrated Circuits Conference (CICC) 2017 IEEE"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2003.813586"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPHOT.2012.2210397"},{"key":"ref9","first-page":"449","article-title":"A CMOS in-pixel CTIA high-sensitivity fluorescence imager","volume":"5 5","author":"kartikeya","year":"2011","journal-title":"IEEE Transactions on Biomedical Circuits and Systems"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/s101009286"}],"event":{"name":"2017 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2017,5,28]]},"location":"Baltimore, MD, USA","end":{"date-parts":[[2017,5,31]]}},"container-title":["2017 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8014728\/8049747\/08051009.pdf?arnumber=8051009","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,3]],"date-time":"2019-10-03T22:12:29Z","timestamp":1570140749000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8051009\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/iscas.2017.8051009","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}