{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T15:55:44Z","timestamp":1781884544293,"version":"3.54.5"},"reference-count":28,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/iscas.2018.8351008","type":"proceedings-article","created":{"date-parts":[[2018,5,4]],"date-time":"2018-05-04T22:00:05Z","timestamp":1525471205000},"page":"1-5","source":"Crossref","is-referenced-by-count":6,"title":["Novel low cost and DNU online self-recoverable RHBD latch design for nanoscale CMOS"],"prefix":"10.1109","author":[{"given":"Qian","family":"He","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Aibin","family":"Yan","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Chaoping","family":"Lai","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yinlei","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Chunming","family":"Liu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhile","family":"Chen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhen","family":"Wu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jie","family":"Cui","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Huaguo","family":"Liang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2012.01.001"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt.2008.0099"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/23.556880"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1587\/transele.E98.C.1171"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2047954"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2007.51"},{"key":"ref16","first-page":"1","article-title":"A high performance SEU-tolerant latch for nanoscale CMOS technology","author":"huang","year":"2014","journal-title":"Proc IEEE Design Automation and Test in Europe Conf"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2011.2177135"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2011.2178265"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2014.16"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2655079"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-015-5551-3"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2645282"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2260357"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090694"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2017.2704062"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2630315"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2016.11.006"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2010.24"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2017.2718029"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-11802-9_30"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-015-5533-5"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2015.03.014"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1049\/el.2014.4374"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2012.6271553"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2016.7684062"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2015.72"}],"event":{"name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Florence","start":{"date-parts":[[2018,5,27]]},"end":{"date-parts":[[2018,5,30]]}},"container-title":["2018 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8334884\/8350884\/08351008.pdf?arnumber=8351008","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,22]],"date-time":"2019-10-22T00:50:08Z","timestamp":1571705408000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8351008\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/iscas.2018.8351008","relation":{},"subject":[],"published":{"date-parts":[[2018,5]]}}}