{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T15:55:18Z","timestamp":1725465318549},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/iscas.2018.8351214","type":"proceedings-article","created":{"date-parts":[[2018,5,4]],"date-time":"2018-05-04T18:00:05Z","timestamp":1525456805000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["Error Probability Models to Facilitate Approximate Computing in TFET based Circuits"],"prefix":"10.1109","author":[{"given":"Mallika","family":"Rathore","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Emre","family":"Salman","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2007.4449513"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2013990"},{"journal-title":"Switching Noise and Timing Characteristics in Nanoscale Integrated Circuits","year":"2009","author":"salman","key":"ref12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TADVP.2004.825480"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.885834"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2011.11.005"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ECCTD.2007.4529559"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1038\/nature10679"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2007.901273"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2008.4796839"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2015.2390591"},{"key":"ref8","article-title":"Predictive technology model","author":"cao","year":"2002","journal-title":"Internet"},{"journal-title":"Iii-v tunnel fet model","year":"2015","author":"liu","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/2701617"},{"journal-title":"High Performance Integrated Circuits","year":"2012","author":"salman","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2584387"}],"event":{"name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2018,5,27]]},"location":"Florence","end":{"date-parts":[[2018,5,30]]}},"container-title":["2018 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8334884\/8350884\/08351214.pdf?arnumber=8351214","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,21]],"date-time":"2019-10-21T20:52:10Z","timestamp":1571691130000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8351214\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/iscas.2018.8351214","relation":{},"subject":[],"published":{"date-parts":[[2018,5]]}}}