{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,21]],"date-time":"2025-10-21T15:29:33Z","timestamp":1761060573550,"version":"3.28.0"},"reference-count":32,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018]]},"DOI":"10.1109\/iscas.2018.8351372","type":"proceedings-article","created":{"date-parts":[[2018,5,4]],"date-time":"2018-05-04T18:00:05Z","timestamp":1525456805000},"page":"1-5","source":"Crossref","is-referenced-by-count":7,"title":["A Robust and Self-Adaptive Clocking Technique for RSFQ Circuits \u2014 The Architecture"],"prefix":"10.1109","author":[{"given":"Ramy N.","family":"Tadros","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Peter A.","family":"Beerel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"ABC A System for Sequential Synthesis and Verification","year":"2007","author":"mishchenko","key":"ref32"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2008.4484001"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/5.24143"},{"key":"ref10","doi-asserted-by":"crossref","first-page":"1 701305","DOI":"10.1109\/TASC.2012.2237215","article-title":"A statistical approach to delay, jitter and timing of signals of RSFQ wiring cells and clocked gates","volume":"23","author":"\u00e7elik","year":"2013","journal-title":"IEEE Transactions on Applied Superconductivity"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1023\/A:1007903527533"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ASYNC.1998.666511"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2005.849773"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/77.919349"},{"journal-title":"MIT-LL 10 kA\/cm2 SFQ Fabrication Process SFQ5ee Design Rules","article-title":"MIT Lincoln Laboratory","year":"2015","key":"ref15"},{"key":"ref16","article-title":"The ISCAS'85 benchmark circuits and netlist format","volume":"25","author":"bryan","year":"1985","journal-title":"North Carolina State University"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1002\/352760278X"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"26","DOI":"10.1109\/PROC.1982.12227","article-title":"the josephson technology","volume":"70","author":"gheewala","year":"1982","journal-title":"Proceedings of the IEEE"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/545214.545219"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/77.233529"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/77.80745"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/0921-4534(96)00426-1"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2010.2096792"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/77.783986"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/77.621826"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1142\/S012915640100085X"},{"key":"ref8","first-page":"1733","article-title":"Parameter variations and synchronization of RSFQ circuits","volume":"148","author":"gaj","year":"1995","journal-title":"Institute of Physics Conf Series"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2005.849856"},{"journal-title":"International Technology Roadmap of Semiconductors 2 0 Beyond CMOS","article-title":"ITRS","year":"2015","key":"ref2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2007.898707"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISEC.2017.8314213"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511674730"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/77.622205"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2016.2565609"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2007.898145"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2003.813892"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/2442087.2442102"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.93.177001"}],"event":{"name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2018,5,27]]},"location":"Florence","end":{"date-parts":[[2018,5,30]]}},"container-title":["2018 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8334884\/8350884\/08351372.pdf?arnumber=8351372","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,21]],"date-time":"2019-10-21T20:52:05Z","timestamp":1571691125000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8351372\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/iscas.2018.8351372","relation":{},"subject":[],"published":{"date-parts":[[2018]]}}}