{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T16:38:08Z","timestamp":1781887088527,"version":"3.54.5"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/iscas.2018.8351482","type":"proceedings-article","created":{"date-parts":[[2018,5,4]],"date-time":"2018-05-04T18:00:05Z","timestamp":1525456805000},"page":"1-4","source":"Crossref","is-referenced-by-count":8,"title":["Radiation hardening design for spin-orbit torque magnetic random access memory"],"prefix":"10.1109","author":[{"given":"Bi","family":"Wang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhaohao","family":"Wang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kaihua","family":"Cao","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Youguang","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yuanfu","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Weisheng","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2014.2304658"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt.2008.0099"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2015.71"},{"key":"ref13","first-page":"714","article-title":"A novel sort error hardening IOT SRAM cell for low voltage operation","author":"jung","year":"2012","journal-title":"IEEE MWSCAS"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/23.25522"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2304738"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2018.2795039"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/47\/40\/405003"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2012.2195677"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/1.4863407"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1038\/nature10309"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2016.2543782"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2016.2521712"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/48\/6\/065001"}],"event":{"name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Florence","start":{"date-parts":[[2018,5,27]]},"end":{"date-parts":[[2018,5,30]]}},"container-title":["2018 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8334884\/8350884\/08351482.pdf?arnumber=8351482","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,21]],"date-time":"2019-10-21T20:52:08Z","timestamp":1571691128000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8351482\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/iscas.2018.8351482","relation":{},"subject":[],"published":{"date-parts":[[2018,5]]}}}