{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,30]],"date-time":"2026-09-30T13:36:48Z","timestamp":1790775408720,"version":"4.1.0"},"reference-count":26,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/iscas.2018.8351490","type":"proceedings-article","created":{"date-parts":[[2018,5,4]],"date-time":"2018-05-04T22:00:05Z","timestamp":1525471205000},"page":"1-5","source":"Crossref","is-referenced-by-count":2,"title":["Exploiting the non-linear current-voltage characteristics for resistive memory readout"],"prefix":"10.1109","author":[{"given":"Nikolaos","family":"Papandreou","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Abu","family":"Sebastian","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Haralampos","family":"Pozidis","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2016.2547718"},{"key":"ref11","author":"ielmini","year":"2015","journal-title":"Resistive Switching From Fundamentals of Nanoionic Redox Processes to Memristive Device Applications"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131482"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.3653279"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2011.5937569"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2004.836032"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.4938532"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1063\/1.2773688"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1088\/1367-2630\/17\/9\/093035"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2007.4339743"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2015.2457243"},{"key":"ref3","first-page":"365","article-title":"Learning spatiotemporal patterns in the presence of input noise using phase-change memristors","author":"wozniak","year":"2016","journal-title":"Proc IEEE International Symposium on Circuits and Systems (ISCAS)"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2017.83"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-017-01481-9"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2010.5724687"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2015.29"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1080\/23746149.2016.1259585"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2016.7495263"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2016.70"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2014.2357176"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms9181"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ICDSP.2013.6622745"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1063\/1.3599559"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms8467"},{"key":"ref26","first-page":"my-1","article-title":"The complete time\/temperature dependence of IV drift in PCM devices","author":"le gallo","year":"2016","journal-title":"Proc IEEE International Reliability Physics Symposium (IRPS)"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2015.7112808"}],"event":{"name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Florence","start":{"date-parts":[[2018,5,27]]},"end":{"date-parts":[[2018,5,30]]}},"container-title":["2018 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8334884\/8350884\/08351490.pdf?arnumber=8351490","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,22]],"date-time":"2019-10-22T00:50:11Z","timestamp":1571705411000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8351490\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/iscas.2018.8351490","relation":{},"subject":[],"published":{"date-parts":[[2018,5]]}}}