{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T07:58:53Z","timestamp":1725609533630},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018]]},"DOI":"10.1109\/iscas.2018.8351673","type":"proceedings-article","created":{"date-parts":[[2018,5,4]],"date-time":"2018-05-04T18:00:05Z","timestamp":1525456805000},"page":"1-4","source":"Crossref","is-referenced-by-count":3,"title":["An Embedded Environmental Control Micro-chamber System for RRAM Memristor Characterisation"],"prefix":"10.1109","author":[{"given":"T.","family":"Abbey","sequence":"first","affiliation":[]},{"given":"A.","family":"Serb","sequence":"additional","affiliation":[]},{"given":"N.","family":"Vasilakis","sequence":"additional","affiliation":[]},{"given":"L.","family":"Michalas","sequence":"additional","affiliation":[]},{"given":"A.","family":"Khiat","sequence":"additional","affiliation":[]},{"given":"S.","family":"Stathopoulos","sequence":"additional","affiliation":[]},{"given":"T.","family":"Prodromakis","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2017.8050398"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2016.7527526"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201101846"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/0470068329"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.7567\/APEX.9.104202"},{"key":"ref2","first-page":"441","article-title":"Live demonstration: A versatile, low-cost platform for testing large ReRAM cross-bar arrays","author":"berdan","year":"2014","journal-title":"2014 IEEE International Symposium on Circuits and Systems (ISCAS)"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2433676"}],"event":{"name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2018,5,27]]},"location":"Florence","end":{"date-parts":[[2018,5,30]]}},"container-title":["2018 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8334884\/8350884\/08351673.pdf?arnumber=8351673","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,21]],"date-time":"2019-10-21T20:51:17Z","timestamp":1571691077000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8351673\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/iscas.2018.8351673","relation":{},"subject":[],"published":{"date-parts":[[2018]]}}}