{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T16:21:26Z","timestamp":1781886086664,"version":"3.54.5"},"reference-count":64,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/iscas.2018.8351756","type":"proceedings-article","created":{"date-parts":[[2018,5,4]],"date-time":"2018-05-04T18:00:05Z","timestamp":1525456805000},"page":"1-5","source":"Crossref","is-referenced-by-count":13,"title":["Coming Up N3XT, After 2D Scaling of Si CMOS"],"prefix":"10.1109","author":[{"given":"William","family":"Hwang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Weier","family":"Wan","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Subhasish","family":"Mitra","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"H.-S. Philip","family":"Wong","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2012.6241871"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2010.2070050"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2015.29"},{"key":"ref32","author":"wong","year":"0","journal-title":"Stanford Memory Trends"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1038\/nature12502"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1038\/nature07110"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2015.24"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2012.6479083"},{"key":"ref35","article-title":"10&#x00D7;10nm2Hf\/HfOxcrossbar resistive RAM with excellent performance, reliability and low-energy operation","author":"govoreanu","year":"2011","journal-title":"IEDM"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2190369"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2016.7573431"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1007\/s12559-009-9009-8"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838428"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1145\/2934583.2934624"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2015.7409815"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2705051"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2187527"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.7b00861"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2014.09.003"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/3079856.3080246"},{"key":"ref20","author":"hills","year":"0","journal-title":"Variation-Aware Nanosystem Design Kit"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2014.7047164"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2457453"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2009.2016562"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1126\/sciadv.1601240"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1021\/nl203701g"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838498"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46493-0_32"},{"key":"ref51","article-title":"Trained Ternary Quantization","author":"zhu","year":"2017","journal-title":"ICLRE"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2015.7372570"},{"key":"ref58","article-title":"Scaling-up resistive synaptic arrays for neuro-inspired architecture: Challenges and prospect","author":"yu","year":"2015","journal-title":"IEDM"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2015.2426495"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2616483"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1038\/nature14441"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2014.7047135"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.3389\/fnins.2014.00205"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2015.7409622"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.5b05147"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ITHERM.2014.6892356"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1021\/acs.nanolett.5b02661"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2016.7573428"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIT.2017.7998202"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIT.2017.7998183"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms9407"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIT.2017.7998174"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1126\/science.aaj1628"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1126\/science.aah4698"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2009.5424281"},{"key":"ref4","article-title":"Energy-Efficient Abundant-Data Computing: The N3XT 1,000X","author":"aly","year":"2015","journal-title":"IEEE Computer"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2009.5424433"},{"key":"ref6","year":"0","journal-title":"All About HMC"},{"key":"ref5","year":"0","journal-title":"NVIDIA Tesla V100 GPU ACCELERATOR"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/3037697.3037702"},{"key":"ref7","article-title":"Special session paper 3D nanosystems enable embedded abundant-data computing","author":"hwang","year":"2017","journal-title":"CODES+ISSS"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1145\/3007787.3001140"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1038\/nature22994"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757460"},{"key":"ref45","article-title":"2D Molybdenum Disulfide (MoS2) Transistors Driving RRAMs with 1T1R Configuration","author":"yang","year":"2017","journal-title":"IEDM"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1145\/3007787.3001139"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2898010"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2746342"},{"key":"ref41","article-title":"Charge Injection Super-Lattice Phase Change Memory for Low Power and High Density Storage Device Applications","author":"takaura","year":"2013","journal-title":"VLSI"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2184542"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838342"}],"event":{"name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Florence","start":{"date-parts":[[2018,5,27]]},"end":{"date-parts":[[2018,5,30]]}},"container-title":["2018 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8334884\/8350884\/08351756.pdf?arnumber=8351756","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,21]],"date-time":"2019-10-21T20:51:36Z","timestamp":1571691096000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8351756\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":64,"URL":"https:\/\/doi.org\/10.1109\/iscas.2018.8351756","relation":{},"subject":[],"published":{"date-parts":[[2018,5]]}}}