{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,23]],"date-time":"2025-09-23T12:54:37Z","timestamp":1758632077656,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/iscas.2019.8702100","type":"proceedings-article","created":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T21:02:28Z","timestamp":1556744548000},"page":"1-5","source":"Crossref","is-referenced-by-count":8,"title":["Aging in CMOS RF Linear Power Amplifiers: Experimental Comparison and Modeling"],"prefix":"10.1109","author":[{"given":"Xavier","family":"Aragones","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Diego","family":"Mateo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Enrique","family":"Barajas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Albert","family":"Crespo-Yepes","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rosana","family":"Rodriguez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Javier","family":"Martin-Martinez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Montserrat","family":"Nafria","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2017.05.021"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2010.2055535"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2005.1489872"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2185549"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2008.06.016"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2007.369873"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"375","DOI":"10.1109\/T-ED.1985.21952","article-title":"Hot-electron-induced MOSFET degradation—Model, monitor, and improvement","volume":"32","author":"hu","year":"1985","journal-title":"IEEE Transactions on Electron Devices"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2017.7954272"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2013.6815442"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2010.2048032"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2009.5135554"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-6163-0"}],"event":{"name":"2019 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2019,5,26]]},"location":"Sapporo, Japan","end":{"date-parts":[[2019,5,29]]}},"container-title":["2019 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8682239\/8702066\/08702100.pdf?arnumber=8702100","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:10:15Z","timestamp":1657854615000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8702100\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/iscas.2019.8702100","relation":{},"subject":[],"published":{"date-parts":[[2019,5]]}}}