{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T07:09:05Z","timestamp":1730272145982,"version":"3.28.0"},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,10,1]],"date-time":"2020-10-01T00:00:00Z","timestamp":1601510400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,10,1]],"date-time":"2020-10-01T00:00:00Z","timestamp":1601510400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,10]]},"DOI":"10.1109\/iscas45731.2020.9180517","type":"proceedings-article","created":{"date-parts":[[2020,9,29]],"date-time":"2020-09-29T09:22:27Z","timestamp":1601371347000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Multi-Corner Parametric Yield Estimation via Bayesian Inference on Bernoulli Distribution with Conjugate Prior"],"prefix":"10.1109","author":[{"given":"Jiahe","family":"Shi","sequence":"first","affiliation":[{"name":"ASIC & System State Key Lab, School of Microelectronics, Fudan University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhengqi","family":"Gao","sequence":"additional","affiliation":[{"name":"ASIC & System State Key Lab, School of Microelectronics, Fudan University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jun","family":"Tao","sequence":"additional","affiliation":[{"name":"ASIC & System State Key Lab, School of Microelectronics, Fudan University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yangfeng","family":"Su","sequence":"additional","affiliation":[{"name":"School of Mathematical Sciences, Fudan University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dian","family":"Zhou","sequence":"additional","affiliation":[{"name":"Dept. of EE, University of Texas at Dallas, Dallas, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xuan","family":"Zeng","sequence":"additional","affiliation":[{"name":"ASIC & System State Key Lab, School of Microelectronics, Fudan University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1145\/2744769.2744832"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"1013","DOI":"10.1109\/TCAD.1987.1270342","article-title":"Statistical performance modeling and parametric yield estimation of MOS VLSI","volume":"6","author":"yu","year":"1987","journal-title":"IEEE Trans on CAD"},{"year":"2007","author":"bishop","journal-title":"Pattern Recognition and Machine Learning","key":"ref6"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1145\/2593069.2593099"},{"year":"1993","author":"singhal","journal-title":"Computer Methods for Circuit Analysis and Design","key":"ref2"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TCAD.2019.2940682"}],"event":{"name":"2020 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2020,10,12]]},"location":"Seville, Spain","end":{"date-parts":[[2020,10,14]]}},"container-title":["2020 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9179985\/9180369\/09180517.pdf?arnumber=9180517","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,15]],"date-time":"2024-01-15T16:02:19Z","timestamp":1705334539000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9180517\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,10]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/iscas45731.2020.9180517","relation":{},"subject":[],"published":{"date-parts":[[2020,10]]}}}