{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:40:20Z","timestamp":1740102020961,"version":"3.37.3"},"reference-count":32,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,5,21]],"date-time":"2023-05-21T00:00:00Z","timestamp":1684627200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,21]],"date-time":"2023-05-21T00:00:00Z","timestamp":1684627200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001843","name":"SERB","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001843","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,5,21]]},"DOI":"10.1109\/iscas46773.2023.10181424","type":"proceedings-article","created":{"date-parts":[[2023,7,21]],"date-time":"2023-07-21T17:19:44Z","timestamp":1689959984000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["A Novel Active Pixel Sensor Architecture with In-Pixel Chopping and Switched Biasing to Reduce the Low-Frequency Noise"],"prefix":"10.1109","author":[{"given":"Kapil","family":"Jainwal","sequence":"first","affiliation":[{"name":"Electrical Engineering and Computer Science Indian Institute of Technology Bhilai,India"}]},{"given":"Mukul","family":"Sarkar","sequence":"additional","affiliation":[{"name":"Electrical Engineering Indian Institute of Technology Delhi,New Delhi,India"}]}],"member":"263","reference":[{"key":"ref13","first-page":"400","article-title":"An 80?Vrms-temporal-noise 82 dB-dynamic-range CMOS image sensor with a 13-to-19b variable-resolution column-parallel folding-integration\/cyclic ADC","author":"seo","year":"2011","journal-title":"IEEE Dig Tech Papers Int Solid-State Circ Conf (ISSCC)"},{"key":"ref12","first-page":"396","article-title":"A1.1e- temporal noise 1\/3.2-inch 8 Mpixel CMOS image sensor using pseudo-multiple sampling","author":"lim","year":"2010","journal-title":"IEEE Int Solid-State Circuits Conf Dig Tech Papers (ISSCC)"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.891714"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.105130"},{"key":"ref31","doi-asserted-by":"crossref","first-page":"1860","DOI":"10.1109\/TIM.2009.2028783","article-title":"Test structure for characterization of low-frequency noise in CMOS technologies","volume":"59","author":"wei","year":"2010","journal-title":"IEEE Trans on Instru and Measure"},{"key":"ref30","article-title":"Continuous-time filters","author":"tsividis","year":"1994","journal-title":"Design of VLSI Circuits for Telecommunications and Signal Processing"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2011.2160391"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2434799"},{"journal-title":"Scientific Charge-Coupled Devices","year":"2000","author":"janesick","key":"ref32"},{"key":"ref2","article-title":"Noise in Sub-Micron CMOS Image Sensor","author":"wang","year":"2010","journal-title":"TUDelft Netherlands"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1980.1051404"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/55.817447"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/4.848208"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.899080"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.884195"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2015.2473694"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/4.303719"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2018.2879722"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2018.2802899"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1981.1051666"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1981.1051671"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052730"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052859"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2023.3236911"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/4.278337"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2890050"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2030600"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2860048"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/5.542410"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1986.1085840"},{"key":"ref6","first-page":"384","article-title":"A 0.7erms temporal-readout-noise CMOS image sensor for low-light-level imaging","author":"chen","year":"2012","journal-title":"IEEE Dig Tech Papers Int Solid-State Circ Conf (ISSCC)"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2011.5746370"}],"event":{"name":"2023 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2023,5,21]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2023,5,25]]}},"container-title":["2023 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10181241\/10181318\/10181424.pdf?arnumber=10181424","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,7]],"date-time":"2023-08-07T17:53:22Z","timestamp":1691430802000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10181424\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5,21]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/iscas46773.2023.10181424","relation":{},"subject":[],"published":{"date-parts":[[2023,5,21]]}}}