{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,2]],"date-time":"2025-11-02T13:54:36Z","timestamp":1762091676373,"version":"build-2065373602"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,5,21]],"date-time":"2023-05-21T00:00:00Z","timestamp":1684627200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,21]],"date-time":"2023-05-21T00:00:00Z","timestamp":1684627200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,5,21]]},"DOI":"10.1109\/iscas46773.2023.10181528","type":"proceedings-article","created":{"date-parts":[[2023,7,21]],"date-time":"2023-07-21T17:19:44Z","timestamp":1689959984000},"page":"1-5","source":"Crossref","is-referenced-by-count":2,"title":["Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation"],"prefix":"10.1109","author":[{"given":"Bernardo Borges","family":"Sandoval","sequence":"first","affiliation":[{"name":"Universidade Federal de Santa Catarina (UFSC),Departamento de Informática e Estatística"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Leonardo H.","family":"Brendler","sequence":"additional","affiliation":[{"name":"Instituto de Informática, PGMICRO\/PPGC - Universidade Federal do Rio Grande do Sul (UFRGS)"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fernanda L.","family":"Kastensmidt","sequence":"additional","affiliation":[{"name":"Instituto de Informática, PGMICRO\/PPGC - Universidade Federal do Rio Grande do Sul (UFRGS)"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ricardo","family":"Reis","sequence":"additional","affiliation":[{"name":"Instituto de Informática, PGMICRO\/PPGC - Universidade Federal do Rio Grande do Sul (UFRGS)"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alexandra L.","family":"Zimpeck","sequence":"additional","affiliation":[{"name":"Universidade Católica de Pelotas (UCPel),Centro de Ciências Sociais e Tecnológicas"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rafael B.","family":"Schvittz","sequence":"additional","affiliation":[{"name":"Universidade Federal de Rio Grande (FURG),Centro de Ciências Computacionais"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cristina","family":"Meinhardt","sequence":"additional","affiliation":[{"name":"Universidade Federal de Santa Catarina (UFSC),Departamento de Informática e Estatística"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2016.04.006"},{"key":"ref12","first-page":"1","article-title":"Exploring gate mapping and transistor sizing to improve radiation robustness: A c17 benchmark case-study","author":"borges sandoval","year":"0","journal-title":"2021 IEEE 22nd Latin American Test Symposium (LATS)"},{"key":"ref15","article-title":"Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system","volume":"4241","author":"carreno","year":"1990","journal-title":"NASA Technical Memorandum"},{"key":"ref14","doi-asserted-by":"crossref","first-page":"2024","DOI":"10.1109\/TNS.1982.4336490","article-title":"Collection of charge on junction nodes from ion tracks","volume":"29","author":"messenger","year":"1982","journal-title":"IEEE Transactions on Nuclear Science"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2018.8617988"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2017.8292064"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.71"},{"key":"ref17","first-page":"1","article-title":"Process-induced vt variability in nanoscale finfets: Does t extraction methods have any impact?","author":"bhoir","year":"0","journal-title":"2020 4th IEEE Electron Devices Technology &amp Manufacturing Conference (EDTM)"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2014.07.023"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2016.2615719"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2854277"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2017.8696238"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS48097.2021.9605724"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3171136"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2016.8093124"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT.2010.5667408"}],"event":{"name":"2023 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2023,5,21]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2023,5,25]]}},"container-title":["2023 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10181241\/10181318\/10181528.pdf?arnumber=10181528","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,7]],"date-time":"2023-08-07T17:54:01Z","timestamp":1691430841000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10181528\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5,21]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/iscas46773.2023.10181528","relation":{},"subject":[],"published":{"date-parts":[[2023,5,21]]}}}