{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,28]],"date-time":"2025-06-28T07:04:43Z","timestamp":1751094283346,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,5,21]],"date-time":"2023-05-21T00:00:00Z","timestamp":1684627200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,21]],"date-time":"2023-05-21T00:00:00Z","timestamp":1684627200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,5,21]]},"DOI":"10.1109\/iscas46773.2023.10181576","type":"proceedings-article","created":{"date-parts":[[2023,7,21]],"date-time":"2023-07-21T13:19:44Z","timestamp":1689945584000},"page":"1-5","source":"Crossref","is-referenced-by-count":2,"title":["A Low Noise Analog Frontend with Wide Temperature and Supply Ranges for Capacitive MEMS Microphones"],"prefix":"10.1109","author":[{"given":"Guoao","family":"Liu","sequence":"first","affiliation":[{"name":"School of Integrated Circuit Science and Engineering, Beihang University,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuanqi","family":"Hu","sequence":"additional","affiliation":[{"name":"School of Integrated Circuit Science and Engineering, Beihang University,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Infineon IM67D130A datasheet","year":"2021","key":"ref13"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2013.6487779"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2009.5325947"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2020.08.001"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3186205"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"187","DOI":"10.1002\/bltj.20113","article-title":"Capacitive MEMS microphones","volume":"10","author":"elko","year":"2005","journal-title":"Bell Labs Technical Journal"},{"journal-title":"Compact Models for Future Generation CMOS UC Berkeley","year":"2011","author":"lu","key":"ref8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1002\/0470855460"},{"key":"ref9","first-page":"53","article-title":"Micropower techniques","author":"vittoz","year":"1994","journal-title":"Design of MOS VLSI circuits for telecommunications"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2019.8902846"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2018.8357029"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/Austrochip.2019.00012"},{"journal-title":"AEC-Q100 Failure Mechanism Based Stress Test Qualification for Integrated Circuits","year":"2014","key":"ref5"}],"event":{"name":"2023 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2023,5,21]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2023,5,25]]}},"container-title":["2023 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10181241\/10181318\/10181576.pdf?arnumber=10181576","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,7]],"date-time":"2023-08-07T13:50:38Z","timestamp":1691416238000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10181576\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5,21]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/iscas46773.2023.10181576","relation":{},"subject":[],"published":{"date-parts":[[2023,5,21]]}}}