{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,20]],"date-time":"2026-03-20T18:05:27Z","timestamp":1774029927766,"version":"3.50.1"},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,5,21]],"date-time":"2023-05-21T00:00:00Z","timestamp":1684627200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,21]],"date-time":"2023-05-21T00:00:00Z","timestamp":1684627200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,5,21]]},"DOI":"10.1109\/iscas46773.2023.10181801","type":"proceedings-article","created":{"date-parts":[[2023,7,21]],"date-time":"2023-07-21T17:19:44Z","timestamp":1689959984000},"page":"1-4","source":"Crossref","is-referenced-by-count":2,"title":["A 1\/1.12-inch $1.4\\mu\\mathrm{m}$-Pitch 50Mpixel 65\/28nm Stacked CMOS Image Sensor using Mulitple Sampling"],"prefix":"10.1109","author":[{"given":"Yunhong","family":"Kim","sequence":"first","affiliation":[{"name":"Samsung Electronics,Hwaseong,South Korea"}]},{"given":"Yunhwan","family":"Jung","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,South Korea"}]},{"given":"Haesik","family":"Sul","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,South Korea"}]},{"given":"Kyoungmin","family":"Koh","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,South Korea"}]}],"member":"263","reference":[{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2010.5433971"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1049\/el:20072490"},{"key":"ref4","first-page":"226","article-title":"Column Parallel Signal Processing Techniques for Reducing Thermal and Random Telegraph Noises in CMOS image sensors","author":"kawahito","year":"2007","journal-title":"International Image Sensor Workshop"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373518"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.884868"},{"key":"ref5","article-title":"Noise Reduction Effects of Column-Parallel Correlated Multiple Sampling and Source-Follower Driving Current Switching for CMOS Image Sensors","author":"kawahito","year":"2009","journal-title":"International Image Sensor Workshop"},{"key":"ref2","first-page":"182","article-title":"A $3.7\\times 3.7\\ \\mu\\ \\mathrm{m}^{2}$ square-pixel CMOS image sensor for digital still camera application","author":"ihara","year":"1998","journal-title":"ISSCC Dig Tech Papers"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3097983"}],"event":{"name":"2023 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Monterey, CA, USA","start":{"date-parts":[[2023,5,21]]},"end":{"date-parts":[[2023,5,25]]}},"container-title":["2023 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10181241\/10181318\/10181801.pdf?arnumber=10181801","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,7]],"date-time":"2023-08-07T17:47:59Z","timestamp":1691430479000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10181801\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5,21]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/iscas46773.2023.10181801","relation":{},"subject":[],"published":{"date-parts":[[2023,5,21]]}}}