{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T07:18:10Z","timestamp":1730272690956,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,5,21]],"date-time":"2023-05-21T00:00:00Z","timestamp":1684627200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,21]],"date-time":"2023-05-21T00:00:00Z","timestamp":1684627200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,5,21]]},"DOI":"10.1109\/iscas46773.2023.10181929","type":"proceedings-article","created":{"date-parts":[[2023,7,21]],"date-time":"2023-07-21T17:19:44Z","timestamp":1689959984000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Modeling Retention Errors on Modern 3D-Flash Products"],"prefix":"10.1109","author":[{"given":"Jianwei","family":"Liao","sequence":"first","affiliation":[{"name":"College of Computer and Information Science, Southwest University,Chongqing,China,400715"}]},{"given":"Jiewen","family":"Tang","sequence":"additional","affiliation":[{"name":"College of Computer and Information Science, Southwest University,Chongqing,China,400715"}]},{"given":"Jun","family":"Li","sequence":"additional","affiliation":[{"name":"College of Computer and Information Science, Southwest University,Chongqing,China,400715"}]},{"given":"Junhao","family":"Luo","sequence":"additional","affiliation":[{"name":"College of Computer and Information Science, Southwest University,Chongqing,China,400715"}]},{"given":"Chenqi","family":"Xiao","sequence":"additional","affiliation":[{"name":"College of Computer and Information Science, Southwest University,Chongqing,China,400715"}]},{"given":"Zhigang","family":"Cai","sequence":"additional","affiliation":[{"name":"College of Computer and Information Science, Southwest University,Chongqing,China,400715"}]},{"given":"Lei","family":"Chen","sequence":"additional","affiliation":[{"name":"Chongqing Aerospace Polytechnic College,Chongqing,China,400021"}]}],"member":"263","reference":[{"key":"ref13","article-title":"WARM: Improving NAND flash memory lifetime with write-hotness aware retention management","author":"yixin","year":"2015","journal-title":"2015 31 st Symposium on Mass Storage Systems and Technologies (MSST)"},{"journal-title":"Applied multivariate statistical analysis","year":"2014","author":"richard arnold","key":"ref12"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1145\/1416944.1416949","article-title":"Write off-loading: Practical power management for enterprise storage","volume":"4","author":"dushyanth","year":"2008","journal-title":"ACM Transactions on Storage (TOS)"},{"key":"ref14","article-title":"OSPADA: One-shot programming aware data allocation policy to improve 3D NAND flash read performance","author":"fei","year":"2018","journal-title":"2018 IEEE 36th International Conference on Computer Design (ICCD)"},{"journal-title":"Nonlinear Least Squares for Inverse Problems Theoretical Foundations and Step-by-Step Guide for Applications","year":"2010","author":"guy","key":"ref11"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2016.7573385"},{"key":"ref2","first-page":"1666","article-title":"Error characterization, mitigation, and recovery in flash-memory-based solid-state drives","author":"yu","year":"0","journal-title":"Proceedings of the IEEE 105 9"},{"key":"ref1","first-page":"1","article-title":"Characterizing 3D floating gate NAND flash: Observations, analyses, and implications","volume":"14","author":"qin","year":"2018","journal-title":"ACM Transactions on Storage (TOS)"},{"key":"ref8","first-page":"475","article-title":"Exploiting asymmetric errors for LDPC decoding optimization on 3D NAND flash memory","volume":"69","author":"qiao","year":"2019","journal-title":"IEEE Transactions on Computers"},{"key":"ref7","article-title":"Characterizing 3D charge trap NAND flash: Observations, analyses and applications","author":"fei","year":"2018","journal-title":"2018 IEEE 36th International Conference on Computer Design (ICCD)"},{"key":"ref9","article-title":"Reliability of 3D NAND flash memory with a focus on read voltage calibration from a system aspect","author":"nikolaos","year":"2019","journal-title":"2019 19th Non-Volatile Memory Technology Symposium (NVMTS)"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2725738"},{"key":"ref3","article-title":"Characterizing the reliability and threshold voltage shifting of 3D charge trap NAND flash","author":"weihua","year":"2019","journal-title":"2019 Design Automation & Test in Europe Conference & Exhibition (DATE)"},{"key":"ref6","first-page":"1","article-title":"Improving 3D NAND flash memory lifetime by tolerating early retention loss and process variation","volume":"2","author":"yixin","year":"0","journal-title":"Proceedings of the ACM on Measurement and Analysis of Computing Systems"},{"key":"ref5","article-title":"Adapting layer RBERs variations of 3D flash memories via multi-granularity progressive LDPC reading","author":"yajuan","year":"2019","journal-title":"2019 56th ACM\/IEEE Design Automation Conference (DAC)"}],"event":{"name":"2023 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2023,5,21]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2023,5,25]]}},"container-title":["2023 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10181241\/10181318\/10181929.pdf?arnumber=10181929","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,7]],"date-time":"2023-08-07T17:46:24Z","timestamp":1691430384000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10181929\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5,21]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/iscas46773.2023.10181929","relation":{},"subject":[],"published":{"date-parts":[[2023,5,21]]}}}