{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,29]],"date-time":"2025-03-29T16:49:24Z","timestamp":1743266964465,"version":"3.37.3"},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,5,28]],"date-time":"2022-05-28T00:00:00Z","timestamp":1653696000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,28]],"date-time":"2022-05-28T00:00:00Z","timestamp":1653696000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100006180","name":"Technology Development","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100006180","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,5,28]]},"DOI":"10.1109\/iscas48785.2022.9937224","type":"proceedings-article","created":{"date-parts":[[2022,11,11]],"date-time":"2022-11-11T20:38:08Z","timestamp":1668199088000},"page":"551-555","source":"Crossref","is-referenced-by-count":4,"title":["A Robust Hybrid CT\/DT 0-2 MASH DSM with Passive Noise-Shaping SAR ADC"],"prefix":"10.1109","author":[{"given":"Ke","family":"Li","sequence":"first","affiliation":[{"name":"University of Macau,State Key Laboratory of Analog and Mixed-Signal VLSI and IME\/ECE-FST,Macao,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sai-Weng","family":"Sin","sequence":"additional","affiliation":[{"name":"University of Macau,State Key Laboratory of Analog and Mixed-Signal VLSI and IME\/ECE-FST,Macao,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Liang","family":"Qi","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University,Department of Micro-Nano Electronics,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Weibing","family":"Zhao","sequence":"additional","affiliation":[{"name":"Amicro Semiconductor Co., Ltd.,Zhuhai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Guoxing","family":"Wang","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University,Department of Micro-Nano Electronics,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.P.","family":"Martins","sequence":"additional","affiliation":[{"name":"University of Macau,State Key Laboratory of Analog and Mixed-Signal VLSI and IME\/ECE-FST,Macao,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.917500"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2217874"},{"key":"ref12","first-page":"466","article-title":"A 0.46 mW 5 MHz-BW 79.7 dB-SNDR noise-shaping SAR ADC with dynamic-amplifier-based FIR-IIR filter","author":"liu","year":"2017","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech"},{"key":"ref13","first-page":"236c","article-title":"A 13b-ENOB 173dB-FoM 2nd-order NS SAR ADC with passive integrators","author":"guo","year":"2017","journal-title":"Proc IEEE Symp VLSI Circuits"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2871081"},{"key":"ref4","first-page":"85","author":"pavan","year":"2017","journal-title":"Understanding Delta-Sigma Data Converters"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1049\/el.2015.1655"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2021916"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2693921"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2942359"},{"key":"ref7","first-page":"33","article-title":"A DT 0--2 MASH ?? modulator with VCO-based quantizer for enhanced linearity","author":"he","year":"2012","journal-title":"IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2571671"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3060859"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS51556.2021.9401651"}],"event":{"name":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2022,5,27]]},"location":"Austin, TX, USA","end":{"date-parts":[[2022,6,1]]}},"container-title":["2022 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9937201\/9937203\/09937224.pdf?arnumber=9937224","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,11,28]],"date-time":"2022-11-28T20:22:52Z","timestamp":1669666972000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9937224\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5,28]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/iscas48785.2022.9937224","relation":{},"subject":[],"published":{"date-parts":[[2022,5,28]]}}}