{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,18]],"date-time":"2026-04-18T03:20:42Z","timestamp":1776482442245,"version":"3.51.2"},"reference-count":28,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,5,28]],"date-time":"2022-05-28T00:00:00Z","timestamp":1653696000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,28]],"date-time":"2022-05-28T00:00:00Z","timestamp":1653696000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001659","name":"Deutsche Forschungsgemeinschaft","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100009318","name":"Helmholtz Association","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100009318","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002701","name":"Ministry of Education","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002701","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,5,28]]},"DOI":"10.1109\/iscas48785.2022.9937570","type":"proceedings-article","created":{"date-parts":[[2022,11,11]],"date-time":"2022-11-11T20:38:08Z","timestamp":1668199088000},"page":"91-95","source":"Crossref","is-referenced-by-count":6,"title":["Analysis of VMM Operations on 1S1R Crossbar Arrays and the Influence of Wire Resistances"],"prefix":"10.1109","author":[{"given":"Rana Walied","family":"Ahmad","sequence":"first","affiliation":[{"name":"Jülich Aachen Research Alliance (JARA)-Fit and Peter Grünberg Institute (PGI-7), Forschungszentrum Jülich GmbH,Jülich,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dirk","family":"Wouters","sequence":"additional","affiliation":[{"name":"JARA-Fit and Institute of Materials in Electrical Engineering and Information Technology II,RWTH Aachen,Aachen,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christopher","family":"Bengel","sequence":"additional","affiliation":[{"name":"JARA-Fit and Institute of Materials in Electrical Engineering and Information Technology II,RWTH Aachen,Aachen,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rainer","family":"Waser","sequence":"additional","affiliation":[{"name":"Jülich Aachen Research Alliance (JARA)-Fit and Peter Grünberg Institute (PGI-7), Forschungszentrum Jülich GmbH,Jülich,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Stephan","family":"Menzel","sequence":"additional","affiliation":[{"name":"Jülich Aachen Research Alliance (JARA)-Fit and Peter Grünberg Institute (PGI-7), Forschungszentrum Jülich GmbH,Jülich,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131653"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2011.2161601"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-TSA.2016.7480484"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1116\/1.4889999"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2492421"},{"key":"ref15","first-page":"1","article-title":"Selector design considerations and requirements for 1 SIR RRAM crossbar array","author":"zhang","year":"2014","journal-title":"2014 IEEE 6th International Memory Workshop (IMW)"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2015.7150302"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2018.8351735"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/NANOARCH47378.2019.181278"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2246791"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.3389\/fnins.2021.651452"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2017.8268468"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2015.2413152"},{"key":"ref3","article-title":"ITRS-The International Technology Roadmap for Semiconductors","year":"2012","journal-title":"Edition 2012"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3007787.3001140"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2019.8702714"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8715178"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2819190"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2015.7168889"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JXCDC.2019.2923745"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.200900375"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2015.2476296"},{"key":"ref22","first-page":"102318","article-title":"RSC Adv","volume":"5","author":"slesazeck","year":"2015"},{"key":"ref21","first-page":"1","article-title":"Improved Switching Stability and the Effect of an Internal Series Resistor in HfO?\/TiO? Bilayer ReRAM Cells","author":"hardtdegen","year":"2018","journal-title":"IEEE Transactions on Electron Devices"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1039\/C8FD00117K"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201101117"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201500825"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/s10825-017-1051-2"}],"event":{"name":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Austin, TX, USA","start":{"date-parts":[[2022,5,27]]},"end":{"date-parts":[[2022,6,1]]}},"container-title":["2022 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9937201\/9937203\/09937570.pdf?arnumber=9937570","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,12]],"date-time":"2022-12-12T19:57:44Z","timestamp":1670875064000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9937570\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5,28]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/iscas48785.2022.9937570","relation":{},"subject":[],"published":{"date-parts":[[2022,5,28]]}}}