{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:25:04Z","timestamp":1740101104373,"version":"3.37.3"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,5,28]],"date-time":"2022-05-28T00:00:00Z","timestamp":1653696000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,28]],"date-time":"2022-05-28T00:00:00Z","timestamp":1653696000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003803","name":"University of Hong Kong","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003803","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,5,28]]},"DOI":"10.1109\/iscas48785.2022.9937785","type":"proceedings-article","created":{"date-parts":[[2022,11,11]],"date-time":"2022-11-11T20:38:08Z","timestamp":1668199088000},"page":"2192-2196","source":"Crossref","is-referenced-by-count":0,"title":["Multi-Attractor and Transient Stability of Islanded Microgrid"],"prefix":"10.1109","author":[{"given":"Jingxi","family":"Yang","sequence":"first","affiliation":[{"name":"City University of Hong Kong,Department of Electrical Engineering,Hong Kong"}]},{"given":"Chi K.","family":"Tse","sequence":"additional","affiliation":[{"name":"City University of Hong Kong,Department of Electrical Engineering,Hong Kong"}]},{"given":"Dong","family":"Liu","sequence":"additional","affiliation":[{"name":"City University of Hong Kong,Department of Electrical Engineering,Hong Kong"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/OJIA.2020.3020392"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/JETCAS.2022.3147487"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1201\/9780203494554"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TPEL.2021.3077245"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/TPEL.2014.2349936"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/TPEL.2019.2892142"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/JETCAS.2015.2462152"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1142\/S0218127413300024"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/ISCAS51556.2021.9401538"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/TCSII.2020.3040860"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1016\/j.cnsns.2020.105362"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/OJCAS.2020.3020633"}],"event":{"name":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2022,5,27]]},"location":"Austin, TX, USA","end":{"date-parts":[[2022,6,1]]}},"container-title":["2022 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9937201\/9937203\/09937785.pdf?arnumber=9937785","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,11,28]],"date-time":"2022-11-28T20:21:32Z","timestamp":1669666892000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9937785\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5,28]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/iscas48785.2022.9937785","relation":{},"subject":[],"published":{"date-parts":[[2022,5,28]]}}}