{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T07:08:40Z","timestamp":1730272120929,"version":"3.28.0"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,5,28]],"date-time":"2022-05-28T00:00:00Z","timestamp":1653696000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,28]],"date-time":"2022-05-28T00:00:00Z","timestamp":1653696000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,5,28]]},"DOI":"10.1109\/iscas48785.2022.9937850","type":"proceedings-article","created":{"date-parts":[[2022,11,11]],"date-time":"2022-11-11T20:38:08Z","timestamp":1668199088000},"page":"975-979","source":"Crossref","is-referenced-by-count":5,"title":["Beneficial Role of Noise in Hf-based Memristors"],"prefix":"10.1109","author":[{"given":"Rosana","family":"Rodriguez","sequence":"first","affiliation":[{"name":"Universitat Autònoma de Barcelona (UAB), Bellaterra,Electronic Engineering Dept., REDEC Group,Barcelona,Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Javier","family":"Martin-Martinez","sequence":"additional","affiliation":[{"name":"Universitat Autònoma de Barcelona (UAB), Bellaterra,Electronic Engineering Dept., REDEC Group,Barcelona,Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Emili","family":"Salvador","sequence":"additional","affiliation":[{"name":"Universitat Autònoma de Barcelona (UAB), Bellaterra,Electronic Engineering Dept., REDEC Group,Barcelona,Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Albert","family":"Crespo-Yepes","sequence":"additional","affiliation":[{"name":"Universitat Autònoma de Barcelona (UAB), Bellaterra,Electronic Engineering Dept., REDEC Group,Barcelona,Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Enrique","family":"Miranda","sequence":"additional","affiliation":[{"name":"Universitat Autònoma de Barcelona (UAB), Bellaterra,Electronic Engineering Dept., REDEC Group,Barcelona,Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Montserrat","family":"Nafria","sequence":"additional","affiliation":[{"name":"Universitat Autònoma de Barcelona (UAB), Bellaterra,Electronic Engineering Dept., REDEC Group,Barcelona,Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Antonio","family":"Rubio","sequence":"additional","affiliation":[{"name":"Universitat Politècnica de Catalunya (UPC),Electronic Engineering Department,Barcelona,Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vasileios","family":"Ntinas","sequence":"additional","affiliation":[{"name":"Universitat Politècnica de Catalunya (UPC),Electronic Engineering Department,Barcelona,Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Georgios Ch.","family":"Sirakoulis","sequence":"additional","affiliation":[{"name":"Democritus University of Thrace (DUTh),Dept. of Electrical & Computer Engineering,Xanthi,Greece"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/INEC.2014.7460454"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"11116","DOI":"10.1103\/PhysRevE.85.011116","article-title":"Stochastic memory: Memory enjancement due to noise","volume":"85","author":"scotland","year":"2012","journal-title":"Physical Review E"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.4819018"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/NANOARCH47378.2019.181299"},{"key":"ref14","doi-asserted-by":"crossref","DOI":"10.1109\/TCSII.2020.3026950","article-title":"Power-Efficient Noise-Induced Reduction of ReRAM Cell’s Temporal Variability Effects","volume":"68","author":"ntinas","year":"2021","journal-title":"IEEE Transactions on Circuits and Systems II Express Briefs"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.chaos.2021.110723"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2017.11.007"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.23919\/SISPAD.2017.8085282"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2017.2677882"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2017.2773124"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-018-0092-2"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2020.2976735"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-017-0002-z"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1038\/373033a0"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/0305-4470\/14\/11\/006"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s12274-020-2616-0"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/aisy.202000105"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/19.997828"}],"event":{"name":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2022,5,27]]},"location":"Austin, TX, USA","end":{"date-parts":[[2022,6,1]]}},"container-title":["2022 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9937201\/9937203\/09937850.pdf?arnumber=9937850","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,11,28]],"date-time":"2022-11-28T20:20:59Z","timestamp":1669666859000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9937850\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5,28]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/iscas48785.2022.9937850","relation":{},"subject":[],"published":{"date-parts":[[2022,5,28]]}}}