{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,24]],"date-time":"2025-08-24T01:09:36Z","timestamp":1755997776623,"version":"3.37.3"},"reference-count":31,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,5,28]],"date-time":"2022-05-28T00:00:00Z","timestamp":1653696000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,28]],"date-time":"2022-05-28T00:00:00Z","timestamp":1653696000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001659","name":"Deutsche Forschungsgemeinschaft","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100009318","name":"Helmholtz Association","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100009318","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100009950","name":"Ministry of Education","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100009950","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003163","name":"Forschungszentrum J\u00fclich","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003163","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,5,28]]},"DOI":"10.1109\/iscas48785.2022.9937918","type":"proceedings-article","created":{"date-parts":[[2022,11,11]],"date-time":"2022-11-11T20:38:08Z","timestamp":1668199088000},"page":"1184-1188","source":"Crossref","is-referenced-by-count":1,"title":["Performance Analysis of Memristive-CNN based on a VCM Device Model"],"prefix":"10.1109","author":[{"given":"Yongmin","family":"Wang","sequence":"first","affiliation":[{"name":"Peter Grünberg Institut (PGI-10),Forschungszentrum Jülich GmbH,Jülich,Germany"}]},{"given":"Alon","family":"Ascoli","sequence":"additional","affiliation":[{"name":"Institute of Circuits and Systems, Technische Universität Dresden,Dresden,Germany"}]},{"given":"Ronald","family":"Tetzlaff","sequence":"additional","affiliation":[{"name":"Institute of Circuits and Systems, Technische Universität Dresden,Dresden,Germany"}]},{"given":"Vikas","family":"Rana","sequence":"additional","affiliation":[{"name":"Peter Grünberg Institut (PGI-10),Forschungszentrum Jülich GmbH,Jülich,Germany"}]},{"given":"Stephan","family":"Menzel","sequence":"additional","affiliation":[{"name":"Peter Grünberg Institut (PGI-7),Forschungszentrum Jülich GmbH,Jülich,Germany"}]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/81.747197"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/MCAS.2013.2296414"},{"key":"ref10","first-page":"1","article-title":"Exploiting the switching dynamics of HfO2-based ReRAM devices for reliable analog memristive behavior","volume":"7","author":"cueppers","year":"2019","journal-title":"Apl Materials"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"16391","DOI":"10.1038\/s41598-020-73254-2","article-title":"Picosecond multilevel resistive switching in tantalum oxide thin films","volume":"10","author":"b\u00f6ttger","year":"2020","journal-title":"Scientific Reports"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1039\/C8FD90058B"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.5108658"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/SNW.2016.7577978"},{"key":"ref15","article-title":"Trade-Off Between Data Retention and Switching Speed in Resistive Switching ReRAM Devices","volume":"7","author":"siegel","year":"2020","journal-title":"Advanced Electronic Materials"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.2978460"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2957813"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2940909"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3389\/fnano.2021.633026"},{"journal-title":"Redox-Based Resistive Random Access Memories","year":"2012","author":"waser","key":"ref28"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2015.2398217"},{"key":"ref27","article-title":"Cellular neural networks and visual computing foundation and applications","author":"chua","year":"2004","journal-title":"The Press Syndicate of the University of Cambridge"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.201500138"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IMW51353.2021.9439591"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/82.222815"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/adma.200900375"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCT.1971.1083337"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1039\/C8FD00108A"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/31.7600"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"319","DOI":"10.13164\/re.2015.0319","article-title":"Everything You Wish to Know About Memristors But Are Afraid to Ask","volume":"24","author":"chua","year":"2015","journal-title":"Radioengineering"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/82.222818"},{"key":"ref20","doi-asserted-by":"crossref","first-page":"209","DOI":"10.1109\/PROC.1976.10092","article-title":"Memristive devices and systems","volume":"64","author":"chua","year":"1976","journal-title":"Proceedings of the IEEE"},{"journal-title":"Linear and Nonlinear Circuits","year":"1987","author":"chua","key":"ref22"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2019.2899262"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2003.818319"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/81.372854"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3018502"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ECCTD49232.2020.9218420"}],"event":{"name":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2022,5,27]]},"location":"Austin, TX, USA","end":{"date-parts":[[2022,6,1]]}},"container-title":["2022 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9937201\/9937203\/09937918.pdf?arnumber=9937918","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,11,28]],"date-time":"2022-11-28T20:20:40Z","timestamp":1669666840000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9937918\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5,28]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/iscas48785.2022.9937918","relation":{},"subject":[],"published":{"date-parts":[[2022,5,28]]}}}