{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,19]],"date-time":"2026-03-19T08:00:04Z","timestamp":1773907204188,"version":"3.50.1"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,5,28]],"date-time":"2022-05-28T00:00:00Z","timestamp":1653696000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,28]],"date-time":"2022-05-28T00:00:00Z","timestamp":1653696000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,5,28]]},"DOI":"10.1109\/iscas48785.2022.9937979","type":"proceedings-article","created":{"date-parts":[[2022,11,11]],"date-time":"2022-11-11T20:38:08Z","timestamp":1668199088000},"page":"2438-2442","source":"Crossref","is-referenced-by-count":6,"title":["A High Area-Efficiency RRAM-Based Strong PUF with Multi-Entropy Source and Configurable Double-Read Process"],"prefix":"10.1109","author":[{"given":"Xianwu","family":"Hu","sequence":"first","affiliation":[{"name":"Fudan University,State Key Laboratory of ASIC and System, School of Microelectronics,Shanghai,China,200433"}]},{"given":"Yu","family":"Wang","sequence":"additional","affiliation":[{"name":"Fudan University,State Key Laboratory of ASIC and System, School of Microelectronics,Shanghai,China,200433"}]},{"given":"Jiayun","family":"Feng","sequence":"additional","affiliation":[{"name":"Fudan University,State Key Laboratory of ASIC and System, School of Microelectronics,Shanghai,China,200433"}]},{"given":"Zizhao","family":"Ma","sequence":"additional","affiliation":[{"name":"Fudan University,State Key Laboratory of ASIC and System, School of Microelectronics,Shanghai,China,200433"}]},{"given":"Xiaoyang","family":"Zeng","sequence":"additional","affiliation":[{"name":"Fudan University,State Key Laboratory of ASIC and System, School of Microelectronics,Shanghai,China,200433"}]},{"given":"Yufeng","family":"Xie","sequence":"additional","affiliation":[{"name":"Fudan University,State Key Laboratory of ASIC and System, School of Microelectronics,Shanghai,China,200433"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310218"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC47793.2019.9056893"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2015.2426492"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2017.2677882"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2017.8268376"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-TSA.2017.7942473"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2963002"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2008.212"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2015.2503707"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/EDTM47692.2020.9117813"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2015.128"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2016.7495549"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/SIPROCESS.2019.8868889"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2320516"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2018.2866425"}],"event":{"name":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Austin, TX, USA","start":{"date-parts":[[2022,5,27]]},"end":{"date-parts":[[2022,6,1]]}},"container-title":["2022 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9937201\/9937203\/09937979.pdf?arnumber=9937979","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,11,28]],"date-time":"2022-11-28T20:22:06Z","timestamp":1669666926000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9937979\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5,28]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/iscas48785.2022.9937979","relation":{},"subject":[],"published":{"date-parts":[[2022,5,28]]}}}