{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,21]],"date-time":"2026-02-21T06:37:47Z","timestamp":1771655867939,"version":"3.50.1"},"reference-count":32,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,5,1]],"date-time":"2021-05-01T00:00:00Z","timestamp":1619827200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,5,1]],"date-time":"2021-05-01T00:00:00Z","timestamp":1619827200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,5,1]],"date-time":"2021-05-01T00:00:00Z","timestamp":1619827200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,5]]},"DOI":"10.1109\/iscas51556.2021.9401136","type":"proceedings-article","created":{"date-parts":[[2021,4,27]],"date-time":"2021-04-27T21:33:36Z","timestamp":1619559216000},"page":"1-5","source":"Crossref","is-referenced-by-count":18,"title":["Estimation of MOSFET Channel Noise and Noise Performance of CMOS LNAs at Cryogenic Temperatures"],"prefix":"10.1109","author":[{"given":"Xuesong","family":"Chen","sequence":"first","affiliation":[]},{"given":"Hazem","family":"Elgabra","sequence":"additional","affiliation":[]},{"given":"Chih-Hung","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Jonathan","family":"Baugh","sequence":"additional","affiliation":[]},{"given":"Lan","family":"Wei","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.821786"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.23919\/MIKON.2018.8514558"},{"key":"ref30","author":"razavi","year":"2012","journal-title":"RF Microelectronics"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.810480"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.877872"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MMW.2005.1511915"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2008.2000614"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2014.6848614"},{"key":"ref15","article-title":"Noise characterization and modeling of nanoscale MOSFETs","author":"chen","year":"2017","journal-title":"Ph D thesis Department of ECE"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2227485"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2005.845078"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2283253"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/0038-1101(95)00223-5"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/4.568846"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-TSA.2019.8804661"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.2004.1368044"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2854701"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19573.2019.8993666"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JRPROC.1944.232049"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2282960"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"1484","DOI":"10.1109\/TED.2002.801229","article-title":"channel noise modeling of deep submicron mosfets","volume":"49","author":"chen","year":"2002","journal-title":"IEEE Transactions on Electron Devices"},{"key":"ref7","author":"van der ziel","year":"1986","journal-title":"Noise in Solid State Devices and Circuits"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2737549"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2005.844735"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.cosrev.2018.11.002"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2193402"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2808184"},{"key":"ref21","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1016\/S0370-1573(99)00123-4","article-title":"Shot noise in mesoscopic conductors","volume":"336","author":"blanter","year":"2000","journal-title":"Phys Rep"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/s10825-004-7044-y"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.1989.38745"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2026512"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/s10825-006-8825-2"}],"event":{"name":"2021 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Daegu, Korea","start":{"date-parts":[[2021,5,22]]},"end":{"date-parts":[[2021,5,28]]}},"container-title":["2021 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9401028\/9401051\/09401136.pdf?arnumber=9401136","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T15:44:09Z","timestamp":1652197449000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9401136\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,5]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/iscas51556.2021.9401136","relation":{},"subject":[],"published":{"date-parts":[[2021,5]]}}}