{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,31]],"date-time":"2026-01-31T06:31:13Z","timestamp":1769841073090,"version":"3.49.0"},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,5,1]],"date-time":"2021-05-01T00:00:00Z","timestamp":1619827200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,5,1]],"date-time":"2021-05-01T00:00:00Z","timestamp":1619827200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,5,1]],"date-time":"2021-05-01T00:00:00Z","timestamp":1619827200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000006","name":"Office of Naval Research","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000006","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,5]]},"DOI":"10.1109\/iscas51556.2021.9401369","type":"proceedings-article","created":{"date-parts":[[2021,4,27]],"date-time":"2021-04-27T21:33:36Z","timestamp":1619559216000},"page":"1-5","source":"Crossref","is-referenced-by-count":3,"title":["Ultra-Low Leakage ESD Protection Achieving 10.5 fA Leakage"],"prefix":"10.1109","author":[{"given":"Corentin","family":"Pochet","sequence":"first","affiliation":[]},{"given":"Haowei","family":"Jiang","sequence":"additional","affiliation":[]},{"given":"Drew A.","family":"Hall","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","article-title":"ADA4530-1 Datasheet and Product Info | Analog Devices","year":"0"},{"key":"ref11","article-title":"LTC6268-10 Datasheet and Product Info | Analog Devices","year":"0"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2003.815938"},{"key":"ref13","year":"2017","journal-title":"Joint JEDEC\/ESDA Standard For Electrostatic Discharge Sensitivity Test - Human Body Model (HBM) - Component Level JEDEC Standard JS-001-2017"},{"key":"ref4","first-page":"1913","article-title":"A 0.1% THD, 1-M? to 1-G? Tunable, Temperature-Compensated Transimpedance Amplifier Using a Multi-Element Pseudo-Resistor","volume":"53","author":"djekic","year":"2018","journal-title":"IEEE JSSC"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2019.8902895"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"173","DOI":"10.1109\/16.737457","article-title":"Whole-chip ESD protection design with efficient VDD-to-VSS ESD clamp circuits for submicron CMOS VLSI","volume":"46","author":"ker","year":"1999","journal-title":"IEEE Trans Electron Devices"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/5.659493"},{"key":"ref8","article-title":"ESD protection design for CMOS RF integrated circuits","author":"ker","year":"2001","journal-title":"EOS\/ESD Symposium"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2012372"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2011.2179419"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310316"},{"key":"ref9","article-title":"Low leakage ESD network for protecting semiconductor devices and method of construction","author":"corsi","year":"1996","journal-title":"U S Patent"}],"event":{"name":"2021 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Daegu, Korea","start":{"date-parts":[[2021,5,22]]},"end":{"date-parts":[[2021,5,28]]}},"container-title":["2021 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9401028\/9401051\/09401369.pdf?arnumber=9401369","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T15:44:16Z","timestamp":1652197456000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9401369\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,5]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/iscas51556.2021.9401369","relation":{},"subject":[],"published":{"date-parts":[[2021,5]]}}}