{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,23]],"date-time":"2025-04-23T05:29:53Z","timestamp":1745386193632},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,5,1]],"date-time":"2021-05-01T00:00:00Z","timestamp":1619827200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,5,1]],"date-time":"2021-05-01T00:00:00Z","timestamp":1619827200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,5,1]],"date-time":"2021-05-01T00:00:00Z","timestamp":1619827200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,5]]},"DOI":"10.1109\/iscas51556.2021.9401763","type":"proceedings-article","created":{"date-parts":[[2021,4,27]],"date-time":"2021-04-27T21:33:36Z","timestamp":1619559216000},"page":"1-5","source":"Crossref","is-referenced-by-count":4,"title":["A 419pW Process-Invariant Temperature Sensor for Ultra-Low Power Microsystems"],"prefix":"10.1109","author":[{"given":"Abhishek","family":"Pullela","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ashfakh","family":"Ali","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Arpan","family":"Jain","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Adithya","family":"Banthi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zia","family":"Abbas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2325574"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2017.8234279"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2916418"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2554883"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2018.2875825"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2016.7527484"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS48704.2020.9184679"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2963566"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2016.2577978"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2007.4405761"},{"key":"ref4","first-page":"200","article-title":"A CMOS Temperature Sensor with a 3? Inaccuracy of &#x00B1;0.5&#x00B0;C From &#x2013;50&#x00B0;C to 120&#x00B0;C","author":"pertijs","year":"2003","journal-title":"ISSCC Dig Tech Papers"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2638464"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2047456"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757409"},{"key":"ref8","first-page":"293","article-title":"A 47nW, 0.7-3.6 V Wide Supply Range, Resistor Based Temperature Sensor for IoT Applications","author":"ali","year":"0","journal-title":"2019 IFIP\/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC)"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2016.113"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2144290"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2214831"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2014.6894411"}],"event":{"name":"2021 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2021,5,22]]},"location":"Daegu, Korea","end":{"date-parts":[[2021,5,28]]}},"container-title":["2021 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9401028\/9401051\/09401763.pdf?arnumber=9401763","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T15:44:13Z","timestamp":1652197453000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9401763\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,5]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/iscas51556.2021.9401763","relation":{},"subject":[],"published":{"date-parts":[[2021,5]]}}}