{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T16:08:02Z","timestamp":1781885282316,"version":"3.54.5"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,5,25]],"date-time":"2025-05-25T00:00:00Z","timestamp":1748131200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,5,25]],"date-time":"2025-05-25T00:00:00Z","timestamp":1748131200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,5,25]]},"DOI":"10.1109\/iscas56072.2025.11043275","type":"proceedings-article","created":{"date-parts":[[2025,6,27]],"date-time":"2025-06-27T17:42:19Z","timestamp":1751046139000},"page":"1-5","source":"Crossref","is-referenced-by-count":2,"title":["SSRNet: Few-shot IC Segmentation in Automated PCB Image Processing"],"prefix":"10.1109","author":[{"given":"Yuhang","family":"Wang","sequence":"first","affiliation":[{"name":"Nanyang Technological University,Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xinrui","family":"Wang","sequence":"additional","affiliation":[{"name":"Nanyang Technological University,Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Deruo","family":"Cheng","sequence":"additional","affiliation":[{"name":"Nanyang Technological University,Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tong","family":"Lin","sequence":"additional","affiliation":[{"name":"Nanyang Technological University,Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Feng","family":"Ji","sequence":"additional","affiliation":[{"name":"Nanyang Technological University,Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yiqiong","family":"Shi","sequence":"additional","affiliation":[{"name":"Nanyang Technological University,Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bah-Hwee","family":"Gwee","sequence":"additional","affiliation":[{"name":"Nanyang Technological University,Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2005.1465948"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS58744.2024.10557973"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/APWiMob56856.2022.10014223"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3395499"},{"key":"ref5","first-page":"1","article-title":"Deep-learning-based x-ray ct slice analysis for layout verification in printed circuit boards","volume-title":"2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS)","author":"Cheng"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-24574-4_28"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/vcip.2017.8305148"},{"key":"ref8","article-title":"Deeplab: Semantic image segmentation with deep convolutional nets, atrous convolution, and fully connected crfs","author":"Chen","year":"2017"},{"key":"ref9","article-title":"Rethinking atrous convolution for semantic image segmentation","volume-title":"CoRR","volume":"abs\/1706.05587","author":"Chen","year":"2017"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.120029"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-19800-7_41"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2020.2992433"},{"issue":"4","key":"ref13","first-page":"491","article-title":"Dbscan: Density-based spatial clustering of applications with noise","volume":"48","author":"Fang-Ming","year":"2012","journal-title":"Journal of Nanjing University(Natural Sciences)"},{"key":"ref14","article-title":"Inverted residuals and linear bottlenecks: Mobile networks for classification, detection and segmentation","volume-title":"CoRR","volume":"abs\/1801.04381","author":"Sandler","year":"2018"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/HOST49136.2021.9702286"}],"event":{"name":"2025 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"London, United Kingdom","start":{"date-parts":[[2025,5,25]]},"end":{"date-parts":[[2025,5,28]]}},"container-title":["2025 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11043142\/11042930\/11043275.pdf?arnumber=11043275","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,28]],"date-time":"2025-06-28T07:10:59Z","timestamp":1751094659000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11043275\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5,25]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/iscas56072.2025.11043275","relation":{},"subject":[],"published":{"date-parts":[[2025,5,25]]}}}