{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,29]],"date-time":"2025-06-29T04:04:19Z","timestamp":1751169859240,"version":"3.41.0"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,5,25]],"date-time":"2025-05-25T00:00:00Z","timestamp":1748131200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,5,25]],"date-time":"2025-05-25T00:00:00Z","timestamp":1748131200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100018542","name":"Natural Science Foundation of Sichuan Province","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100018542","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,5,25]]},"DOI":"10.1109\/iscas56072.2025.11043288","type":"proceedings-article","created":{"date-parts":[[2025,6,27]],"date-time":"2025-06-27T17:42:19Z","timestamp":1751046139000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Stack-based Ensemble Learning for Performance Indirect Testing of Analog Integrated Circuits"],"prefix":"10.1109","author":[{"given":"Jiawei","family":"Cao","sequence":"first","affiliation":[{"name":"University of Electronic Science and Technology of China,School of Automation Engineering,Chengdu,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Houjun","family":"Wang","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China,Shenzhen Institute for Advanced Study,Shenzhen,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhigang","family":"Wang","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China,School of Automation Engineering,Chengdu,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hao","family":"Li","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China,School of Automation Engineering,Chengdu,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/43.986428"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ETSYM.2010.5512726"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2012.2205480"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2783302"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-021-05934-4"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8714798"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/5.0093709"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-020-05868-3"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3279927"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s13369-023-08340-4"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2024.3496777"},{"key":"ref12","article-title":"Spectre Simulation Platform"}],"event":{"name":"2025 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2025,5,25]]},"location":"London, United Kingdom","end":{"date-parts":[[2025,5,28]]}},"container-title":["2025 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11043142\/11042930\/11043288.pdf?arnumber=11043288","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,28]],"date-time":"2025-06-28T06:23:38Z","timestamp":1751091818000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11043288\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5,25]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/iscas56072.2025.11043288","relation":{},"subject":[],"published":{"date-parts":[[2025,5,25]]}}}