{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,28]],"date-time":"2025-06-28T07:10:09Z","timestamp":1751094609515,"version":"3.41.0"},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,5,25]],"date-time":"2025-05-25T00:00:00Z","timestamp":1748131200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,5,25]],"date-time":"2025-05-25T00:00:00Z","timestamp":1748131200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,5,25]]},"DOI":"10.1109\/iscas56072.2025.11043449","type":"proceedings-article","created":{"date-parts":[[2025,6,27]],"date-time":"2025-06-27T17:42:19Z","timestamp":1751046139000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["A 70 pW Self-Compensated Subthreshold Voltage Reference Achieving 190 \u00b0C Temperature Range and 0.07%\/V Line Sensitivity"],"prefix":"10.1109","author":[{"given":"Xiaoxian","family":"Feng","sequence":"first","affiliation":[{"name":"Fudan University,State Key Laboratory of Integrated Chips and Systems (SKLICS),China"}]},{"given":"Yingping","family":"Chen","sequence":"additional","affiliation":[{"name":"Fudan University,State Key Laboratory of Integrated Chips and Systems (SKLICS),China"}]},{"given":"Qi","family":"Liu","sequence":"additional","affiliation":[{"name":"Fudan University,State Key Laboratory of Integrated Chips and Systems (SKLICS),China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3033467"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2206683"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC56115.2022.9980681"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/CICC48029.2020.9075941"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2754644"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3028506"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2654326"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3188451"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3231216"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3088157"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1017\/cbo9781139195065"}],"event":{"name":"2025 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2025,5,25]]},"location":"London, United Kingdom","end":{"date-parts":[[2025,5,28]]}},"container-title":["2025 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11043142\/11042930\/11043449.pdf?arnumber=11043449","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,28]],"date-time":"2025-06-28T06:41:18Z","timestamp":1751092878000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11043449\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5,25]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/iscas56072.2025.11043449","relation":{},"subject":[],"published":{"date-parts":[[2025,5,25]]}}}