{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,29]],"date-time":"2025-06-29T04:04:20Z","timestamp":1751169860954,"version":"3.41.0"},"reference-count":26,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,5,25]],"date-time":"2025-05-25T00:00:00Z","timestamp":1748131200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,5,25]],"date-time":"2025-05-25T00:00:00Z","timestamp":1748131200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,5,25]]},"DOI":"10.1109\/iscas56072.2025.11043454","type":"proceedings-article","created":{"date-parts":[[2025,6,27]],"date-time":"2025-06-27T17:42:19Z","timestamp":1751046139000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Memristor Resistance State Tuning with High-Frequency Periodic Inputs"],"prefix":"10.1109","author":[{"given":"I.","family":"Messaris","sequence":"first","affiliation":[{"name":"TUD | Dresden University of Technology,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V.","family":"Ntinas","sequence":"additional","affiliation":[{"name":"TUD | Dresden University of Technology,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Prousalis","sequence":"additional","affiliation":[{"name":"TUD | Dresden University of Technology,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A. S.","family":"Demirkol","sequence":"additional","affiliation":[{"name":"TUD | Dresden University of Technology,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Tetzlaff","sequence":"additional","affiliation":[{"name":"TUD | Dresden University of Technology,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Zhang","sequence":"additional","affiliation":[{"name":"Julich Research Center,Peter Grünberg Institute,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V.","family":"Rana","sequence":"additional","affiliation":[{"name":"Julich Research Center,Peter Grünberg Institute,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Menzel","sequence":"additional","affiliation":[{"name":"Julich Research Center,Peter Grünberg Institute,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Ascoli","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Department of Electronics and Telecommunications,Turin,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1080\/23746149.2016.1259585"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2018.01.009"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-018-07052-w"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2018.8351882"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-018-04624-8"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1038\/s42256-019-0089-1"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2940909"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1038\/s41578-022-00434-z"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.13164\/re.2015.0319"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/23\/7\/075201"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.procs.2014.11.094"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/27\/36\/365202"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-017-17785-1"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2915100"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3389\/fnins.2020.00103"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-023-05759-5"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3389\/fnano.2024.1301320"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.202400172"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3219368"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3160304"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/SMACD58065.2023.10192107"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3018502"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2849872"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1002\/adma.200900375"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevApplied.6.064015"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.201670006"}],"event":{"name":"2025 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2025,5,25]]},"location":"London, United Kingdom","end":{"date-parts":[[2025,5,28]]}},"container-title":["2025 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11043142\/11042930\/11043454.pdf?arnumber=11043454","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,28]],"date-time":"2025-06-28T06:47:08Z","timestamp":1751093228000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11043454\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5,25]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/iscas56072.2025.11043454","relation":{},"subject":[],"published":{"date-parts":[[2025,5,25]]}}}