{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T15:51:39Z","timestamp":1781884299754,"version":"3.54.5"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,5,25]],"date-time":"2025-05-25T00:00:00Z","timestamp":1748131200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,5,25]],"date-time":"2025-05-25T00:00:00Z","timestamp":1748131200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,5,25]]},"DOI":"10.1109\/iscas56072.2025.11043464","type":"proceedings-article","created":{"date-parts":[[2025,6,27]],"date-time":"2025-06-27T17:42:19Z","timestamp":1751046139000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["A 250M-2.5GHz Two-Stage Duty-Cycle Corrector with 10%-90% Correction Range and 3-Cycle Correction Latency for Mitigating Aging Effects"],"prefix":"10.1109","author":[{"given":"Zhiting","family":"Li","sequence":"first","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China,210096"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Lishuo","family":"Deng","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China,210096"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Cai","family":"Li","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China,210096"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Changwei","family":"Yan","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China,210096"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhangrui","family":"Qian","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China,210096"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Weiwei","family":"Shan","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China,210096"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC49657.2024.10454421"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DFT56152.2022.9962342"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS202256217.2022.9970984"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2018.8353658"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS45731.2020.9180946"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2370631"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2015.2394486"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2018.2811412"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS51556.2021.9401792"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2021447"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2260186"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/ell2.12793"}],"event":{"name":"2025 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"London, United Kingdom","start":{"date-parts":[[2025,5,25]]},"end":{"date-parts":[[2025,5,28]]}},"container-title":["2025 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11043142\/11042930\/11043464.pdf?arnumber=11043464","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,28]],"date-time":"2025-06-28T06:25:30Z","timestamp":1751091930000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11043464\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5,25]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/iscas56072.2025.11043464","relation":{},"subject":[],"published":{"date-parts":[[2025,5,25]]}}}