{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,3]],"date-time":"2026-07-03T20:22:42Z","timestamp":1783110162415,"version":"3.54.6"},"reference-count":29,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,5,25]],"date-time":"2025-05-25T00:00:00Z","timestamp":1748131200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,5,25]],"date-time":"2025-05-25T00:00:00Z","timestamp":1748131200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,5,25]]},"DOI":"10.1109\/iscas56072.2025.11043579","type":"proceedings-article","created":{"date-parts":[[2025,6,27]],"date-time":"2025-06-27T13:42:19Z","timestamp":1751031739000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["A Failure Detection Technique for Au-Plated CMOS Microelectrode Arrays"],"prefix":"10.1109","author":[{"given":"Xin","family":"Zhang","sequence":"first","affiliation":[{"name":"University College London,Department of Electrical and Electronic Engineering,London,United Kingdom"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Minghao","family":"Li","sequence":"additional","affiliation":[{"name":"University College London,Department of Electrical and Electronic Engineering,London,United Kingdom"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sara S.","family":"Ghoreishizadeh","sequence":"additional","affiliation":[{"name":"University College London,Department of Electrical and Electronic Engineering,London,United Kingdom"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/BioCAS.2011.6107788"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1021\/cr068113+"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3236068"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2018.2797063"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2017.2733624"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/s7123442"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LASCAS53948.2022.9789069"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.819174"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2011.2171339"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/BioSensors61405.2024.10712712"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/S0927-7765(99)00148-4"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/elan.201200194"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s002160051556"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1111\/j.1399-6576.1995.tb04255.x"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/BioSensors61405.2024.10712689"},{"key":"ref16","volume-title":"Electrochemical methods: fundamentals and applications.","author":"Bard","year":"2022"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.electacta.2016.11.074"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1002\/slct.202001411"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2018.12.008"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1002\/elan.202100406"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1021\/acs.analchem.6b04308"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1021\/ar200196h"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1039\/C9AN02017A"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/LSENS.2017.2778248"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3289619"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/LSENS.2024.3404153"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.5006\/1.3280607"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/S0022-0728(84)80324-1"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijhydene.2019.05.183"}],"event":{"name":"2025 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"London, United Kingdom","start":{"date-parts":[[2025,5,25]]},"end":{"date-parts":[[2025,5,28]]}},"container-title":["2025 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11043142\/11042930\/11043579.pdf?arnumber=11043579","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,3]],"date-time":"2026-07-03T19:48:09Z","timestamp":1783108089000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11043579\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5,25]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/iscas56072.2025.11043579","relation":{},"subject":[],"published":{"date-parts":[[2025,5,25]]}}}