{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T16:09:30Z","timestamp":1781885370924,"version":"3.54.5"},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,5,25]],"date-time":"2025-05-25T00:00:00Z","timestamp":1748131200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,5,25]],"date-time":"2025-05-25T00:00:00Z","timestamp":1748131200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,5,25]]},"DOI":"10.1109\/iscas56072.2025.11043663","type":"proceedings-article","created":{"date-parts":[[2025,6,27]],"date-time":"2025-06-27T17:42:19Z","timestamp":1751046139000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["A Total Noise Power Based Digital Calibration Method for Continuous-Time Delta-Sigma Modulators"],"prefix":"10.1109","author":[{"given":"Zhuojian","family":"Yao","sequence":"first","affiliation":[{"name":"Tsinghua University,School of Integrated Circuits,Beijing,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Haikun","family":"Jia","sequence":"additional","affiliation":[{"name":"Tsinghua University,School of Integrated Circuits,Beijing,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Lilan","family":"Yu","sequence":"additional","affiliation":[{"name":"BriRadio Technology Company Ltd,Chengdu,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Junfeng","family":"Liu","sequence":"additional","affiliation":[{"name":"Tsinghua University,School of Integrated Circuits,Beijing,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yu","family":"Fu","sequence":"additional","affiliation":[{"name":"Tsinghua University,School of Integrated Circuits,Beijing,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wei","family":"Deng","sequence":"additional","affiliation":[{"name":"Tsinghua University,School of Integrated Circuits,Beijing,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Baoyong","family":"Chi","sequence":"additional","affiliation":[{"name":"Tsinghua University,School of Integrated Circuits,Beijing,China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"Understanding Delta-Sigma Data Converters","author":"Pavan","year":"2017"},{"key":"ref2","volume-title":"Continuous-Time Sigma-Delta A\/D Conversion: Fundamentals, Performance Limits and Robust Implementations, ser. Springer Series in Advanced Microelectronics","author":"Ortmanns","year":"2006"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.836245"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.856284"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9366006"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2036759"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9063026"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/4.881204"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2909032"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731602"}],"event":{"name":"2025 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"London, United Kingdom","start":{"date-parts":[[2025,5,25]]},"end":{"date-parts":[[2025,5,28]]}},"container-title":["2025 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11043142\/11042930\/11043663.pdf?arnumber=11043663","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,28]],"date-time":"2025-06-28T06:36:56Z","timestamp":1751092616000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11043663\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5,25]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/iscas56072.2025.11043663","relation":{},"subject":[],"published":{"date-parts":[[2025,5,25]]}}}