{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,25]],"date-time":"2026-08-25T23:12:59Z","timestamp":1787699579497,"version":"build-2784847793"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,5,25]],"date-time":"2025-05-25T00:00:00Z","timestamp":1748131200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,5,25]],"date-time":"2025-05-25T00:00:00Z","timestamp":1748131200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,5,25]]},"DOI":"10.1109\/iscas56072.2025.11043858","type":"proceedings-article","created":{"date-parts":[[2025,6,27]],"date-time":"2025-06-27T13:42:19Z","timestamp":1751031739000},"page":"1-5","source":"Crossref","is-referenced-by-count":4,"title":["A Novel Parallel Convolution-Self-Attention Neural Network Based Calibration Scheme for Pipelined and Pipelined-SAR ADCs"],"prefix":"10.1109","author":[{"given":"Xizhu","family":"Peng","sequence":"first","affiliation":[{"name":"University of Electronic Science and Technology of China,School of Integrated Circuit Science and Engineering,Chengdu,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bowen","family":"Zhang","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China,School of Integrated Circuit Science and Engineering,Chengdu,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhifei","family":"Lu","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China,School of Integrated Circuit Science and Engineering,Chengdu,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jinda","family":"Yang","sequence":"additional","affiliation":[{"name":"Chengdu Sino Microelectronics Technology Company Ltd.,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jie","family":"Pu","sequence":"additional","affiliation":[{"name":"Chengdu Sino Microelectronics Technology Company Ltd.,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"He","family":"Tang","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China,School of Integrated Circuit Science and Engineering,Chengdu,China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1049\/PBCS026E"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2361339"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3023882"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3044831"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3133829"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/EDTM50988.2021.9420899"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2019.8902873"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT49897.2020.9278216"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2020.3012386"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3201016"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS46773.2023.10181892"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.48550\/ARXIV.1706.03762"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00009"},{"key":"ref14","first-page":"23495","article-title":"Inception Transformer","volume-title":"Proc. Adv. Neural Inf. Process. Syst","volume":"35","author":"Si"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2022.01.039"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2923704"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/19.492802"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2017.07.002"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-58536-5_5"}],"event":{"name":"2025 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"London, United Kingdom","start":{"date-parts":[[2025,5,25]]},"end":{"date-parts":[[2025,5,28]]}},"container-title":["2025 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11043142\/11042930\/11043858.pdf?arnumber=11043858","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,28]],"date-time":"2025-06-28T02:13:57Z","timestamp":1751076837000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11043858\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5,25]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/iscas56072.2025.11043858","relation":{},"subject":[],"published":{"date-parts":[[2025,5,25]]}}}