{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,8]],"date-time":"2026-01-08T10:34:00Z","timestamp":1767868440097,"version":"3.49.0"},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,5,25]],"date-time":"2025-05-25T00:00:00Z","timestamp":1748131200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,5,25]],"date-time":"2025-05-25T00:00:00Z","timestamp":1748131200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100006190","name":"Research and Development","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100006190","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,5,25]]},"DOI":"10.1109\/iscas56072.2025.11044174","type":"proceedings-article","created":{"date-parts":[[2025,6,27]],"date-time":"2025-06-27T13:42:19Z","timestamp":1751031739000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["A High-Sensitivity and Wide-Dynamic-Range Image Sensor with Extended-Silicon Responsive Spectrum from 254 nm to 1310 nm"],"prefix":"10.1109","author":[{"given":"Tao","family":"Ma","sequence":"first","affiliation":[{"name":"Sun Yat-sen University,Guangdong Province Key Laboratory of Display Material and Technology State Key Laboratory of Optoelectronic Materials and Technologies School of Electronics and Information Technology,Guangzhou,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaolin","family":"Liu","sequence":"additional","affiliation":[{"name":"Sun Yat-sen University,Guangdong Province Key Laboratory of Display Material and Technology State Key Laboratory of Optoelectronic Materials and Technologies School of Electronics and Information Technology,Guangzhou,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xin","family":"Jin","sequence":"additional","affiliation":[{"name":"Sun Yat-sen University,Guangdong Province Key Laboratory of Display Material and Technology State Key Laboratory of Optoelectronic Materials and Technologies School of Electronics and Information Technology,Guangzhou,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chao","family":"Gao","sequence":"additional","affiliation":[{"name":"Sun Yat-sen University,Guangdong Province Key Laboratory of Display Material and Technology State Key Laboratory of Optoelectronic Materials and Technologies School of Electronics and Information Technology,Guangzhou,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhou","family":"Zhou","sequence":"additional","affiliation":[{"name":"Sun Yat-sen University,Guangdong Province Key Laboratory of Display Material and Technology State Key Laboratory of Optoelectronic Materials and Technologies School of Electronics and Information Technology,Guangzhou,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kai","family":"Wang","sequence":"additional","affiliation":[{"name":"Sun Yat-sen University,Guangdong Province Key Laboratory of Display Material and Technology State Key Laboratory of Optoelectronic Materials and Technologies School of Electronics and Information Technology,Guangzhou,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yihong","family":"Qi","sequence":"additional","affiliation":[{"name":"National Innovation Center for Advanced Medical Devices,Shenzhen,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1126\/science.abe0722"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1126\/sciadv.abb0576"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.125.117702"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19574.2021.9720558"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1201\/9781315156255"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3142436"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.device.2024.100357"}],"event":{"name":"2025 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"London, United Kingdom","start":{"date-parts":[[2025,5,25]]},"end":{"date-parts":[[2025,5,28]]}},"container-title":["2025 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11043142\/11042930\/11044174.pdf?arnumber=11044174","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,1,8]],"date-time":"2026-01-08T05:00:39Z","timestamp":1767848439000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11044174\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5,25]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/iscas56072.2025.11044174","relation":{},"subject":[],"published":{"date-parts":[[2025,5,25]]}}}