{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T08:17:02Z","timestamp":1725783422735},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,19]],"date-time":"2024-05-19T00:00:00Z","timestamp":1716076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,19]],"date-time":"2024-05-19T00:00:00Z","timestamp":1716076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,19]]},"DOI":"10.1109\/iscas58744.2024.10557978","type":"proceedings-article","created":{"date-parts":[[2024,7,2]],"date-time":"2024-07-02T17:22:52Z","timestamp":1719940972000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["A 0.8-ps RMS Precision Period Jitter Measurement Circuit with Offset Reduction"],"prefix":"10.1109","author":[{"given":"Lin","family":"Xie","sequence":"first","affiliation":[{"name":"Shanghai Jiao Tong University,Department of Micro\/Nano Electronics,Shanghai,China,200240"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zizheng","family":"Dong","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University,Department of Micro\/Nano Electronics,Shanghai,China,200240"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jialei","family":"Sun","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University,Department of Micro\/Nano Electronics,Shanghai,China,200240"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sai","family":"Gao","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University,Department of Micro\/Nano Electronics,Shanghai,China,200240"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shuaipeng","family":"Li","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University,Department of Micro\/Nano Electronics,Shanghai,China,200240"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Naifeng","family":"Jing","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University,Department of Micro\/Nano Electronics,Shanghai,China,200240"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qin","family":"Wang","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University,Department of Micro\/Nano Electronics,Shanghai,China,200240"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jianfei","family":"Jiang","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University,Department of Micro\/Nano Electronics,Shanghai,China,200240"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VDAT.2011.5783600"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2015.7168594"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7063035"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.910109"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2006.1705318"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/4.585289"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2008.4523300"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3226167"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2005.1494094"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2004.1332738"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2020.3005774"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2211655"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.884402"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2899902"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2003.820531"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2006476"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/NSSMIC.2008.4775079"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2569626"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/NEWCAS.2010.5603945"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2016.2606627"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310213"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3013709"},{"key":"ref23","first-page":"1","article-title":"IEEE standard for jitter and phase noise","year":"2021","journal-title":"IEEE Std 2414-2020"}],"event":{"name":"2024 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2024,5,19]]},"location":"Singapore, Singapore","end":{"date-parts":[[2024,5,22]]}},"container-title":["2024 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10557746\/10557828\/10557978.pdf?arnumber=10557978","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,7,3]],"date-time":"2024-07-03T06:45:05Z","timestamp":1719989105000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10557978\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,19]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/iscas58744.2024.10557978","relation":{},"subject":[],"published":{"date-parts":[[2024,5,19]]}}}