{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T08:15:38Z","timestamp":1725783338788},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,19]],"date-time":"2024-05-19T00:00:00Z","timestamp":1716076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,19]],"date-time":"2024-05-19T00:00:00Z","timestamp":1716076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,19]]},"DOI":"10.1109\/iscas58744.2024.10557985","type":"proceedings-article","created":{"date-parts":[[2024,7,2]],"date-time":"2024-07-02T17:22:52Z","timestamp":1719940972000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["A Cryogenic Phase-Selection Superconducting Qubit Controller with Envelope-Tracking in 28nm Bulk CMOS"],"prefix":"10.1109","author":[{"given":"Yanshu","family":"Guo","sequence":"first","affiliation":[{"name":"Nanyang Technological University,School of Electrical and Electronic Engineering,Singapore,639798"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wenqiang","family":"Huang","sequence":"additional","affiliation":[{"name":"Tsinghua University,School of Integrated Circuits,Beijing,China,10084"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yaoyu","family":"Li","sequence":"additional","affiliation":[{"name":"Tsinghua University,School of Integrated Circuits,Beijing,China,10084"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tian","family":"Tian","sequence":"additional","affiliation":[{"name":"Tsinghua University,School of Integrated Circuits,Beijing,China,10084"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yange","family":"Wang","sequence":"additional","affiliation":[{"name":"Nanyang Technological University,School of Electrical and Electronic Engineering,Singapore,639798"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shiquan","family":"Wang","sequence":"additional","affiliation":[{"name":"Nanyang Technological University,School of Electrical and Electronic Engineering,Singapore,639798"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhihua","family":"Wang","sequence":"additional","affiliation":[{"name":"Tsinghua University,School of Integrated Circuits,Beijing,China,10084"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hanjun","family":"Jiang","sequence":"additional","affiliation":[{"name":"Tsinghua University,School of Integrated Circuits,Beijing,China,10084"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuanjin","family":"Zheng","sequence":"additional","affiliation":[{"name":"Nanyang Technological University,School of Electrical and Electronic Engineering,Singapore,639798"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/3061639.3072948"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2021.3072807"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870362"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662480"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9063109"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365762"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3201775"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3024678"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731574"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42615.2023.10067671"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42615.2023.10067495"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1038\/npjqi.2016.33"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3233441"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/icsict.2008.4734982"}],"event":{"name":"2024 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2024,5,19]]},"location":"Singapore, Singapore","end":{"date-parts":[[2024,5,22]]}},"container-title":["2024 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10557746\/10557828\/10557985.pdf?arnumber=10557985","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,7,3]],"date-time":"2024-07-03T06:50:06Z","timestamp":1719989406000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10557985\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,19]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/iscas58744.2024.10557985","relation":{},"subject":[],"published":{"date-parts":[[2024,5,19]]}}}