{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,26]],"date-time":"2026-03-26T16:07:43Z","timestamp":1774541263206,"version":"3.50.1"},"reference-count":35,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,19]],"date-time":"2024-05-19T00:00:00Z","timestamp":1716076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,19]],"date-time":"2024-05-19T00:00:00Z","timestamp":1716076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100002241","name":"Japan Science and Technology Agency","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002241","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,19]]},"DOI":"10.1109\/iscas58744.2024.10558343","type":"proceedings-article","created":{"date-parts":[[2024,7,2]],"date-time":"2024-07-02T17:22:52Z","timestamp":1719940972000},"page":"1-5","source":"Crossref","is-referenced-by-count":4,"title":["A Unified OTP and PUF Exploiting Post-Program Current on Standard CMOS Technology"],"prefix":"10.1109","author":[{"given":"Ronaldo","family":"Serrano","sequence":"first","affiliation":[{"name":"The University of Electro-Communications (UEC),Tokyo,Japan"}]},{"given":"Ckristian","family":"Duran","sequence":"additional","affiliation":[{"name":"The University of Electro-Communications (UEC),Tokyo,Japan"}]},{"given":"Marco","family":"Sarmiento","sequence":"additional","affiliation":[{"name":"The University of Electro-Communications (UEC),Tokyo,Japan"}]},{"given":"Khai-Duy","family":"Nguyen","sequence":"additional","affiliation":[{"name":"The University of Electro-Communications (UEC),Tokyo,Japan"}]},{"given":"Tetsuya","family":"Iizuka","sequence":"additional","affiliation":[{"name":"The University of Tokyo,Tokyo,Japan"}]},{"given":"Trong-Thuc","family":"Hoang","sequence":"additional","affiliation":[{"name":"The University of Electro-Communications (UEC),Tokyo,Japan"}]},{"given":"Cong-Kha","family":"Pham","sequence":"additional","affiliation":[{"name":"The University of Electro-Communications (UEC),Tokyo,Japan"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3169767"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3064788"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2004.827287"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19574.2021.9720641"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS46773.2023.10181362"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2020.2976735"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS45731.2020.9180411"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3167690"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2004.1332586"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9366019"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2016.7476195"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2019.2922711"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/S3S46989.2019.9320721"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.23919\/VLSICircuits52068.2021.9492438"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2060460"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2003.815429"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3138365"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISMVL.2017.10"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3099534"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3125255"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3390\/fi14100298"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ISOCC56007.2022.10031300"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2011.2158054"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2009.5173335"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1995.499353"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1063\/1.125036"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/55.924847"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS49266.2020.9294935"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.3390\/fi14100298"},{"key":"ref30","article-title":"Ibex RISC-V Core","year":"2020"},{"key":"ref31","article-title":"SiFive TileLink Specication","year":"2019"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS49266.2020.9294935"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2012.2230500"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3153359"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2020.3011648"}],"event":{"name":"2024 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Singapore, Singapore","start":{"date-parts":[[2024,5,19]]},"end":{"date-parts":[[2024,5,22]]}},"container-title":["2024 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10557746\/10557828\/10558343.pdf?arnumber=10558343","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,7,3]],"date-time":"2024-07-03T08:04:12Z","timestamp":1719993852000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10558343\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,19]]},"references-count":35,"URL":"https:\/\/doi.org\/10.1109\/iscas58744.2024.10558343","relation":{},"subject":[],"published":{"date-parts":[[2024,5,19]]}}}