{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,18]],"date-time":"2026-03-18T13:41:54Z","timestamp":1773841314232,"version":"3.50.1"},"reference-count":16,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,19]],"date-time":"2024-05-19T00:00:00Z","timestamp":1716076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,19]],"date-time":"2024-05-19T00:00:00Z","timestamp":1716076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,19]]},"DOI":"10.1109\/iscas58744.2024.10558475","type":"proceedings-article","created":{"date-parts":[[2024,7,2]],"date-time":"2024-07-02T17:22:52Z","timestamp":1719940972000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Impact of S\/D Extension Length and Sheet Stacking on Transient Behavior of Nanosheet FETs"],"prefix":"10.1109","author":[{"given":"Shobhit","family":"Srivastava","sequence":"first","affiliation":[{"name":"S.V. National Institute of Technology,Department of Electronics Engineering,Surat,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sachin","family":"Doge","sequence":"additional","affiliation":[{"name":"S.V. National Institute of Technology,Department of Electronics Engineering,Surat,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sourabh","family":"Panwar","sequence":"additional","affiliation":[{"name":"S.V. National Institute of Technology,Department of Electronics Engineering,Surat,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shashidhara","family":"M","sequence":"additional","affiliation":[{"name":"S.V. National Institute of Technology,Department of Electronics Engineering,Surat,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vivek","family":"Garg","sequence":"additional","affiliation":[{"name":"S.V. National Institute of Technology,Department of Electronics Engineering,Surat,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shivendra","family":"Yadav","sequence":"additional","affiliation":[{"name":"S.V. National Institute of Technology,Department of Electronics Engineering,Surat,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lomash","family":"Chandra","sequence":"additional","affiliation":[{"name":"IIT Roorkee,Department of Electronics and Communication Engineering,Uttarakhand,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Abhishek","family":"Acharya","sequence":"additional","affiliation":[{"name":"S.V. National Institute of Technology,Department of Electronics Engineering,Surat,India"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2980925"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2019.2927001"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2022.3184915"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/iscas46773.2023.10181707"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2013.2291013"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.23919\/vlsit.2017.7998183"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2023.3270398"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/EDTM55494.2023.10103127"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3124472"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2022.3227942"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2825498"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19573.2019.8993490"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2023.108758"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3019022"},{"key":"ref15","volume-title":"Sentaurus Device, User Manual, Version Y-2019; Synopsys Inc.","year":"2019"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.23919\/SNW57900.2023.10183928"}],"event":{"name":"2024 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Singapore, Singapore","start":{"date-parts":[[2024,5,19]]},"end":{"date-parts":[[2024,5,22]]}},"container-title":["2024 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10557746\/10557828\/10558475.pdf?arnumber=10558475","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,7,3]],"date-time":"2024-07-03T06:42:18Z","timestamp":1719988938000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10558475\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,19]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/iscas58744.2024.10558475","relation":{},"subject":[],"published":{"date-parts":[[2024,5,19]]}}}