{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,3]],"date-time":"2025-10-03T08:59:45Z","timestamp":1759481985215},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,19]],"date-time":"2024-05-19T00:00:00Z","timestamp":1716076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,19]],"date-time":"2024-05-19T00:00:00Z","timestamp":1716076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,19]]},"DOI":"10.1109\/iscas58744.2024.10558528","type":"proceedings-article","created":{"date-parts":[[2024,7,2]],"date-time":"2024-07-02T17:22:52Z","timestamp":1719940972000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["Backscatter Sensing with Single-tag Path Variation Cancelling"],"prefix":"10.1109","author":[{"given":"Taotao","family":"Wu","sequence":"first","affiliation":[{"name":"Fudan Ubiversity,School of Microelectronics,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuxiao","family":"Zhao","sequence":"additional","affiliation":[{"name":"Fudan Ubiversity,School of Microelectronics,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kuanfeng","family":"Tang","sequence":"additional","affiliation":[{"name":"Fudan Ubiversity,School of Microelectronics,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haoyu","family":"Jiang","sequence":"additional","affiliation":[{"name":"Fudan Ubiversity,School of Microelectronics,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wentao","family":"Liu","sequence":"additional","affiliation":[{"name":"Fudan Ubiversity,School of Microelectronics,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tuo","family":"Hu","sequence":"additional","affiliation":[{"name":"Fudan Ubiversity,School of Microelectronics,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Meng","family":"Liu","sequence":"additional","affiliation":[{"name":"Fudan Ubiversity,School of Microelectronics,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hanyang","family":"Wang","sequence":"additional","affiliation":[{"name":"Fudan Ubiversity,School of Microelectronics,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hao","family":"Min","sequence":"additional","affiliation":[{"name":"Fudan Ubiversity,School of Microelectronics,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.2989585"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3282171"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/RFID58307.2023.10178679"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2015.2503643"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2861431"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3130064"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2021.3079448"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2016.2518871"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LAWP.2017.2721432"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/RFID58307.2023.10178643"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JRFID.2021.3098624"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/RFID52461.2021.9444326"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/BalkanCom53780.2021.9593263"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS48785.2022.9937436"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2020.3048248"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/RFID.2008.4519368"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1515\/FREQ.2009.63.1-2.9"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JRFID.2022.3233855"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/RFID.2010.5467253"}],"event":{"name":"2024 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2024,5,19]]},"location":"Singapore, Singapore","end":{"date-parts":[[2024,5,22]]}},"container-title":["2024 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10557746\/10557828\/10558528.pdf?arnumber=10558528","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,7,3]],"date-time":"2024-07-03T06:44:57Z","timestamp":1719989097000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10558528\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,19]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/iscas58744.2024.10558528","relation":{},"subject":[],"published":{"date-parts":[[2024,5,19]]}}}